{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:23:36Z","timestamp":1725593016207},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,8,1]],"date-time":"2019-08-01T00:00:00Z","timestamp":1564617600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,8,1]],"date-time":"2019-08-01T00:00:00Z","timestamp":1564617600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,8,1]],"date-time":"2019-08-01T00:00:00Z","timestamp":1564617600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,8]]},"DOI":"10.1109\/mwscas.2019.8884830","type":"proceedings-article","created":{"date-parts":[[2019,10,31]],"date-time":"2019-10-31T19:44:38Z","timestamp":1572551078000},"page":"327-330","source":"Crossref","is-referenced-by-count":0,"title":["Allocating Gate Reliability for Circuit Reliability Optimization"],"prefix":"10.1109","author":[{"given":"Suoyue","family":"Zhan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Khawja","family":"Sikander","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chunhong","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.07.154"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2009139"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2017.08.006"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2184145"},{"journal-title":"Simulation and the Monte Carlo Method","year":"2008","author":"rubinstein","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2220386"}],"event":{"name":"2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2019,8,4]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2019,8,7]]}},"container-title":["2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8882388\/8884793\/08884830.pdf?arnumber=8884830","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T17:52:40Z","timestamp":1658080360000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8884830\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,8]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2019.8884830","relation":{},"subject":[],"published":{"date-parts":[[2019,8]]}}}