{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T05:07:37Z","timestamp":1725599257269},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,8,9]],"date-time":"2021-08-09T00:00:00Z","timestamp":1628467200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,8,9]],"date-time":"2021-08-09T00:00:00Z","timestamp":1628467200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,8,9]]},"DOI":"10.1109\/mwscas47672.2021.9531840","type":"proceedings-article","created":{"date-parts":[[2021,9,13]],"date-time":"2021-09-13T22:17:52Z","timestamp":1631571472000},"page":"644-647","source":"Crossref","is-referenced-by-count":0,"title":["An Approximate Timing-Mismatch Calibration Technique for Interleaved ADCs"],"prefix":"10.1109","author":[{"given":"Dursun","family":"Baran","sequence":"first","affiliation":[{"name":"Informatics and Information Security Research Center - Bilgem,Integrated Circuit Design and Training Laboratory,Turkey"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Enes","family":"Karav","sequence":"additional","affiliation":[{"name":"Informatics and Information Security Research Center - Bilgem,Sensor and Antenna Systems Department,Turkey"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hakan","family":"Yaren","sequence":"additional","affiliation":[{"name":"Informatics and Information Security Research Center - Bilgem,Sensor and Antenna Systems Department,Turkey"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2793535"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2258814"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2793535"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/81.915383"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757481"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1980.1051512"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.804327"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2019.07.007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2239005"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2661481"}],"event":{"name":"2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2021,8,9]]},"location":"Lansing, MI, USA","end":{"date-parts":[[2021,8,11]]}},"container-title":["2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9531648\/9531647\/09531840.pdf?arnumber=9531840","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T23:11:53Z","timestamp":1659481913000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9531840\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,8,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/mwscas47672.2021.9531840","relation":{},"subject":[],"published":{"date-parts":[[2021,8,9]]}}}