{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:47:59Z","timestamp":1725587279021},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,8]]},"DOI":"10.1109\/mwscas48704.2020.9184450","type":"proceedings-article","created":{"date-parts":[[2020,9,2]],"date-time":"2020-09-02T16:53:58Z","timestamp":1599065638000},"page":"880-884","source":"Crossref","is-referenced-by-count":0,"title":["Deterministic Dither Based Mismatch Characterization of Wide Range of Metal-Oxide-Metal Capacitors"],"prefix":"10.1109","author":[{"given":"Harshit","family":"Roy","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arkaprova","family":"Ray","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bibhu Datta","family":"Sahoo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/19.843074"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0263-2241(97)00010-9"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/19.293456"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2252518"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/4.173093"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378338"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2537824"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2332264"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/el.2011.3804"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320861"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2642820"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2731262"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2013.2254731"}],"event":{"name":"2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2020,8,9]]},"location":"Springfield, MA, USA","end":{"date-parts":[[2020,8,12]]}},"container-title":["2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9178719\/9184428\/09184450.pdf?arnumber=9184450","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T17:53:07Z","timestamp":1656438787000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9184450\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,8]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/mwscas48704.2020.9184450","relation":{},"subject":[],"published":{"date-parts":[[2020,8]]}}}