{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T14:35:36Z","timestamp":1725633336098},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,8,7]],"date-time":"2022-08-07T00:00:00Z","timestamp":1659830400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,7]],"date-time":"2022-08-07T00:00:00Z","timestamp":1659830400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,8,7]]},"DOI":"10.1109\/mwscas54063.2022.9859464","type":"proceedings-article","created":{"date-parts":[[2022,8,22]],"date-time":"2022-08-22T20:02:33Z","timestamp":1661198553000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Enhanced laser trimming of thin film resistors dedicated to snubber for high power IGBT modules"],"prefix":"10.1109","author":[{"given":"Ryosuke","family":"Watanabe","sequence":"first","affiliation":[{"name":"Hirosaki University,Aomori,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shigeru","family":"Hidaka","sequence":"additional","affiliation":[{"name":"Nikkohm.co.,Ltd."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tomoya","family":"Akasaka","sequence":"additional","affiliation":[{"name":"Hirosaki University,Aomori,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shota","family":"Kajiya","sequence":"additional","affiliation":[{"name":"Hirosaki University,Aomori,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Taisei","family":"Arima","sequence":"additional","affiliation":[{"name":"Hirosaki University,Aomori,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Atsushi","family":"Kurokawa","sequence":"additional","affiliation":[{"name":"Hirosaki University,Aomori,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshiki","family":"Kanamoto","sequence":"additional","affiliation":[{"name":"Hirosaki University,Aomori,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1991.176727"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.1991.163896"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197807"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"242","DOI":"10.1109\/ECTC.1996.517398","article-title":"Reducing optoelectric response when functionally tuning thin-film resistors on silicon IC’s","author":"barcey","year":"1996","journal-title":"1996 Proceedings 46th Electronic Components and Technology Conference"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SMICND.2007.4519763"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2007.908030"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2093770"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2012.2223468"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICSAE.2016.7810165"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MIEL.2017.8190097"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/28.649974"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICEPT50128.2020.9202651"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISHCE.2018.8521224"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PEDG.2016.7527071"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCHMT.1980.1135579"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1587\/nolta.11.253"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2015.7104522"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/WCT.2004.239990"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/16.2487"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MIEL.2019.8889587"},{"journal-title":"Murata Software Co Ltd","year":"0","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/YAC53711.2021.9486463"}],"event":{"name":"2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2022,8,7]]},"location":"Fukuoka, Japan","end":{"date-parts":[[2022,8,10]]}},"container-title":["2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9859262\/9859267\/09859464.pdf?arnumber=9859464","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T19:57:39Z","timestamp":1663012659000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9859464\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8,7]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/mwscas54063.2022.9859464","relation":{},"subject":[],"published":{"date-parts":[[2022,8,7]]}}}