{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T16:19:16Z","timestamp":1759335556460},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,8,6]],"date-time":"2023-08-06T00:00:00Z","timestamp":1691280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,8,6]],"date-time":"2023-08-06T00:00:00Z","timestamp":1691280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,8,6]]},"DOI":"10.1109\/mwscas57524.2023.10405901","type":"proceedings-article","created":{"date-parts":[[2024,1,31]],"date-time":"2024-01-31T18:29:15Z","timestamp":1706725755000},"page":"167-171","source":"Crossref","is-referenced-by-count":3,"title":["A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS"],"prefix":"10.1109","author":[{"given":"Andrew","family":"Ash","sequence":"first","affiliation":[{"name":"School of Electrical and Computer Engineering, Oklahoma State University,Stillwater,OK,USA"}]},{"given":"John","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Oklahoma State University,Stillwater,OK,USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2018.2820147"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/vlsic.2019.8778093"},{"volume-title":"ADC Performance Survey 1997\u20132022","year":"2023","author":"Murmann","key":"ref3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2008.2000480"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/icmts.2018.8383790"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2005.855826"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tns.1982.4336490"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2002.805429"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/radecs47380.2019.9745705"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.3002421"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2004.839161"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2008.923437"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2008.2006895"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-022-02054-7"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2006.884788"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2014.2299762"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2005.853696"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/4.826812"}],"event":{"name":"2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2023,8,6]]},"location":"Tempe, AZ, USA","end":{"date-parts":[[2023,8,9]]}},"container-title":["2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10405424\/10405847\/10405901.pdf?arnumber=10405901","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,2]],"date-time":"2024-02-02T00:03:49Z","timestamp":1706832229000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10405901\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8,6]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/mwscas57524.2023.10405901","relation":{},"subject":[],"published":{"date-parts":[[2023,8,6]]}}}