{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,10]],"date-time":"2025-12-10T09:05:21Z","timestamp":1765357521959},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,8,6]],"date-time":"2023-08-06T00:00:00Z","timestamp":1691280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,8,6]],"date-time":"2023-08-06T00:00:00Z","timestamp":1691280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,8,6]]},"DOI":"10.1109\/mwscas57524.2023.10405906","type":"proceedings-article","created":{"date-parts":[[2024,1,31]],"date-time":"2024-01-31T18:29:15Z","timestamp":1706725755000},"page":"987-990","source":"Crossref","is-referenced-by-count":1,"title":["A 400-MS\/s 10-Bit SAR-Assisted Two-Step Digital-Slope ADC"],"prefix":"10.1109","author":[{"given":"Hao","family":"Deng","sequence":"first","affiliation":[{"name":"University of Houston,Houston,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Runxi","family":"Zhang","sequence":"additional","affiliation":[{"name":"East China Normal University,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinghong","family":"Chen","sequence":"additional","affiliation":[{"name":"University of Houston,Houston,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2108133"},{"key":"ref2","first-page":"C268","article-title":"A 2.1 mW 11 b 410 MS\/s dynamic pipelined SAR ADC with background calibration in 28nm digital CMOS","volume-title":"Symp. VLSI Circuit Dig. Tech. Papers","author":"Verbruggen","year":"2013"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2017.2695720"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/asscc.2010.5716582"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/rfic.2012.6242328"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.2987697"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2016.2591822"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2019.8702383"}],"event":{"name":"2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2023,8,6]]},"location":"Tempe, AZ, USA","end":{"date-parts":[[2023,8,9]]}},"container-title":["2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10405424\/10405847\/10405906.pdf?arnumber=10405906","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,2]],"date-time":"2024-02-02T00:04:05Z","timestamp":1706832245000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10405906\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8,6]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/mwscas57524.2023.10405906","relation":{},"subject":[],"published":{"date-parts":[[2023,8,6]]}}}