{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T03:12:09Z","timestamp":1772766729939,"version":"3.50.1"},"reference-count":31,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,8,6]],"date-time":"2023-08-06T00:00:00Z","timestamp":1691280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,8,6]],"date-time":"2023-08-06T00:00:00Z","timestamp":1691280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["2146754"],"award-info":[{"award-number":["2146754"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,8,6]]},"DOI":"10.1109\/mwscas57524.2023.10405958","type":"proceedings-article","created":{"date-parts":[[2024,1,31]],"date-time":"2024-01-31T18:29:15Z","timestamp":1706725755000},"page":"30-34","source":"Crossref","is-referenced-by-count":5,"title":["Identification of Stealthy Hardware Trojans through On-Chip Temperature Sensing and an Autoencoder-Based Machine Learning Algorithm"],"prefix":"10.1109","author":[{"given":"Thomas","family":"Gourousis","sequence":"first","affiliation":[{"name":"Northeastern University,Dept. of Electrical and Computer Engineering,Boston,MA,USA"}]},{"given":"Ziyue","family":"Zhang","sequence":"additional","affiliation":[{"name":"Northeastern University,Dept. of Electrical and Computer Engineering,Boston,MA,USA"}]},{"given":"Mengting","family":"Yan","sequence":"additional","affiliation":[{"name":"Northeastern University,Dept. of Electrical and Computer Engineering,Boston,MA,USA"}]},{"given":"Millin","family":"Zhang","sequence":"additional","affiliation":[{"name":"Northeastern University,Dept. of Electrical and Computer Engineering,Boston,MA,USA"}]},{"given":"Ankit","family":"Mittal","sequence":"additional","affiliation":[{"name":"Northeastern University,Dept. of Electrical and Computer Engineering,Boston,MA,USA"}]},{"given":"Aatmesh","family":"Shrivastava","sequence":"additional","affiliation":[{"name":"Northeastern University,Dept. of Electrical and Computer Engineering,Boston,MA,USA"}]},{"given":"Francesco","family":"Restuccia","sequence":"additional","affiliation":[{"name":"Northeastern University,Dept. of Electrical and Computer Engineering,Boston,MA,USA"}]},{"given":"Yunsi","family":"Fei","sequence":"additional","affiliation":[{"name":"Northeastern University,Dept. of Electrical and Computer Engineering,Boston,MA,USA"}]},{"given":"Marvin","family":"Onabajo","sequence":"additional","affiliation":[{"name":"Northeastern University,Dept. of Electrical and Computer Engineering,Boston,MA,USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2921831"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523289"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2013.6571782"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/INFOCOM.2019.8737459"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/INFOCOM41043.2020.9155461"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3047020"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2018.8623865"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DCAS51144.2020.9330638"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691167"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.61"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2029117"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/iscas48785.2022.9937796"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICASID.2017.8285768"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2424929"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/4.896232"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.914306"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2072372"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2013.2293668"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355901"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/AMS.2008.105"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/SMC.2018.00080"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2014.79"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/WTS.2018.8363930"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3097983.3098052"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISTEL.2018.8661129"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jeconom.2020.07.009"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TBDATA.2017.2717439"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-50835-1_5"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/3097983.3098077"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/2988450.2988456"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2023.110176"}],"event":{"name":"2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)","location":"Tempe, AZ, USA","start":{"date-parts":[[2023,8,6]]},"end":{"date-parts":[[2023,8,9]]}},"container-title":["2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10405424\/10405847\/10405958.pdf?arnumber=10405958","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,2]],"date-time":"2024-02-02T00:11:09Z","timestamp":1706832669000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10405958\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8,6]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/mwscas57524.2023.10405958","relation":{},"subject":[],"published":{"date-parts":[[2023,8,6]]}}}