{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T08:47:21Z","timestamp":1725698841923},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,7]]},"DOI":"10.1109\/nanoarch.2015.7180596","type":"proceedings-article","created":{"date-parts":[[2015,8,12]],"date-time":"2015-08-12T22:41:22Z","timestamp":1439419282000},"page":"112-117","source":"Crossref","is-referenced-by-count":7,"title":["Evolution of radiation-induced soft errors in FinFET SRAMs under process variations beyond 22nm"],"prefix":"10.1109","author":[{"given":"Pablo","family":"Royer","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fernando","family":"Garcia-Redondo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marisa","family":"Lopez-Vallejo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2033798"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2316505"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.35"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.50"},{"key":"ref14","article-title":"Radiation-induced soft errors in digital circuits-a literature survey","author":"heijmen","year":"2002","journal-title":"Philips Electronics National Laboratory Netherlands Report 2002\/828 Citeseer"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/23.736546"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2360035"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2015.7102516"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2015.01.003"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VARI.2014.6957082"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.848021"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2011.6131303"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796663"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2063270"},{"year":"0","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251220"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2042613"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICE-CCN.2013.6528505"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2013.6674775"}],"event":{"name":"2015 IEEE\/ACM International Symposium on Nanoscale Architectures (NANOARCH)","start":{"date-parts":[[2015,7,8]]},"location":"Boston, MA, USA","end":{"date-parts":[[2015,7,10]]}},"container-title":["Proceedings of the 2015 IEEE\/ACM International Symposium on Nanoscale Architectures (NANOARCH\u00b415)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7164206\/7180573\/07180596.pdf?arnumber=7180596","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,25]],"date-time":"2017-03-25T06:43:16Z","timestamp":1490424196000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7180596\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,7]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/nanoarch.2015.7180596","relation":{},"subject":[],"published":{"date-parts":[[2015,7]]}}}