{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T09:35:39Z","timestamp":1725701739966},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/natw.2017.7938023","type":"proceedings-article","created":{"date-parts":[[2017,6,5]],"date-time":"2017-06-05T20:44:44Z","timestamp":1496695484000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["Peer pressure on identity: On requirements for disambiguating PUFs in noisy environment"],"prefix":"10.1109","author":[{"given":"Pavithra","family":"Ramesh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vinay C.","family":"Patil","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sandip","family":"Kundu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495550"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581558"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855565"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0522"},{"journal-title":"Efficient Fuzzy Extractors for Reconfigurable Hardware","year":"2004","key":"ref14"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"332","DOI":"10.1007\/978-3-642-04138-9_24","article-title":"Low-overhead implementation of a soft decision helper data algorithm for SRAM PUFs","author":"maes","year":"2009","journal-title":"Cryptographic Hardware and Embedded Systems-CHES 2009"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2370531"},{"key":"ref17","first-page":"73","article-title":"An Accurate Probabilistic Reliability Model for Silicon PUFs","author":"maes","year":"0","journal-title":"Proceedings of the 15th International Conference on Cryptographic Hardware and Embedded Systems ser CHES'13"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"90","DOI":"10.1007\/978-3-642-40349-1_6","article-title":"A high reliability PUF using hot carrier injection based response reinforcement","author":"bhargava","year":"2013","journal-title":"Cryptographic Hardware and Embedded Systems-CHES 2013"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865541"},{"key":"ref28","doi-asserted-by":"crossref","first-page":"368","DOI":"10.1109\/ISQED.2016.7479229","article-title":"On testing physically unclonable functions for uniqueness","author":"vijayakumar","year":"2016","journal-title":"Quality Electronic Design (IS QED) 2016 17th International Symposium on"},{"journal-title":"The Internet of Things","year":"2016","author":"evans","key":"ref4"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2014.7001347"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/586110.586132"},{"journal-title":"Extracting secret keys from integrated circuits","year":"2004","author":"lim","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346548"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1145\/1278480.1278484","article-title":"physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref7","first-page":"237","article-title":"Modeling Attacks on Physical Unclonable Functions","author":"r\u00fchrmair","year":"0","journal-title":"Proceedings of the 17th ACM Conference on Computer and Communications Security Ser CCS '10"},{"journal-title":"Security Engineering A Guide to Building Dependable Distributed Systems","year":"2001","author":"anderson","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681648"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855586"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2014.6783361"},{"journal-title":"Identification circuit and method for generating an identification bit using physical unclonable functions","year":"2013","author":"bucci","key":"ref21"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757433"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2015.7085443"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-1362-2_11"},{"key":"ref25","first-page":"70","article-title":"An efficient reliable PUF-based cryptographic key generator in 65nm CMOS","author":"bhargava","year":"2014","journal-title":"Proc Design Automation & Test Europe Conf"}],"event":{"name":"2017 IEEE North Atlantic Test Workshop (NATW)","start":{"date-parts":[[2017,5,8]]},"location":"Providence, RI, USA","end":{"date-parts":[[2017,5,10]]}},"container-title":["2017 IEEE North Atlantic Test Workshop (NATW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7937762\/7938018\/07938023.pdf?arnumber=7938023","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,25]],"date-time":"2019-09-25T16:52:50Z","timestamp":1569430370000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7938023\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/natw.2017.7938023","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}