{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,16]],"date-time":"2026-05-16T09:21:44Z","timestamp":1778923304591,"version":"3.51.4"},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/natw.2019.8758743","type":"proceedings-article","created":{"date-parts":[[2019,7,12]],"date-time":"2019-07-12T00:31:41Z","timestamp":1562891501000},"page":"206-211","source":"Crossref","is-referenced-by-count":1,"title":["Behavioral Modeling of a Charge Trap Transistor One Time Programmable Memory"],"prefix":"10.1109","author":[{"given":"Eric","family":"Hunt-Schroeder","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Darren","family":"Anand","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Edward","family":"Hwang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aaron","family":"Cummings","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matthew","family":"Deming","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Roberge","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Ziegerhofer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","author":"singh","year":"2017","journal-title":"14nm FinFET technology for analog and RF applications"},{"key":"ref3","first-page":"87","author":"hunt-schroeder","year":"2018","journal-title":"14NM FinFET 1 5MB Embedded High-K Charge Trap Transistor One Time Programmable Memory Using Dynamic Adaptive Programming"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870330"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405850"}],"event":{"name":"2019 IEEE 28th North Atlantic Test Workshop (NATW)","location":"Burlington, VT, USA","start":{"date-parts":[[2019,5,13]]},"end":{"date-parts":[[2019,5,15]]}},"container-title":["2019 IEEE 28th North Atlantic Test Workshop (NATW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8753145\/8758708\/08758743.pdf?arnumber=8758743","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:09:57Z","timestamp":1657854597000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8758743\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/natw.2019.8758743","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}