{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,28]],"date-time":"2025-11-28T18:50:25Z","timestamp":1764355825789,"version":"3.46.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2013,4,1]],"date-time":"2013-04-01T00:00:00Z","timestamp":1364774400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2013,4,1]],"date-time":"2013-04-01T00:00:00Z","timestamp":1364774400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/nems.2013.6559809","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:29:19Z","timestamp":1374766159000},"page":"633-636","source":"Crossref","is-referenced-by-count":0,"title":["Analysis of second-order radial mode dips in racetrack optical ring resonator based on SOI rib waveguide"],"prefix":"10.1109","author":[{"family":"Wei Liping","sequence":"first","affiliation":[{"name":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, China"}]},{"family":"Xue Chenyang","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, China"}]},{"family":"Zang Junbin","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, China"}]},{"family":"Cui Danfeng","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, China"}]},{"family":"Wang Yonghua","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, China"}]},{"family":"Zhang Wendong","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, China"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1364\/OL.32.001683"},{"key":"2","volume":"19","author":"abdulla","year":"2011","journal-title":"Optics Express 15864"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1364\/OE.16.004309"},{"key":"7","doi-asserted-by":"crossref","first-page":"528","DOI":"10.1049\/el:20058198","article-title":"Single mode condition and zero birefringence in small SOI waveguides","volume":"41","author":"chan","year":"2005","journal-title":"Electron Lett"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1117\/12.666758"},{"key":"5","volume":"19","author":"integlia","year":"2010","journal-title":"Optics Express 14892"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1364\/OE.14.012401"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1827337"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/68.992585"}],"event":{"name":"2013 8th IEEE International Conference on Nano\/Micro Engineered and Molecular Systems (NEMS)","start":{"date-parts":[[2013,4,7]]},"location":"Suzhou, China","end":{"date-parts":[[2013,4,10]]}},"container-title":["The 8th Annual IEEE International Conference on Nano\/Micro Engineered and Molecular Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6556708\/6559668\/06559809.pdf?arnumber=6559809","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,28]],"date-time":"2025-11-28T18:41:21Z","timestamp":1764355281000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6559809\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/nems.2013.6559809","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}