{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,20]],"date-time":"2024-09-20T16:21:35Z","timestamp":1726849295570},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/nems.2017.8017049","type":"proceedings-article","created":{"date-parts":[[2017,8,29]],"date-time":"2017-08-29T15:38:24Z","timestamp":1504021104000},"page":"392-397","source":"Crossref","is-referenced-by-count":1,"title":["AFM assisted DNA sequencing based on electronic tunneling"],"prefix":"10.1109","author":[{"given":"Bo","family":"Ma","sequence":"first","affiliation":[]},{"given":"Steve","family":"Tung","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0006-3495(03)74673-6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/srep08442"},{"journal-title":"Fluctuation and Correlation Effects in Electrostatics of Highly-Charged Surfaces","year":"2000","author":"lau","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1021\/jp9525907"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.1702682"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.110.058102"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1021\/nl080473k"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nmeth0409-244a"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/ja057123+"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/25\/27\/275501"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/srep00501"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/nl051063o"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/bies.200900181"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nature09796"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s100510050980"}],"event":{"name":"2017 IEEE 12th International Conference on Nano\/Micro Engineered and Molecular Systems (NEMS)","start":{"date-parts":[[2017,4,9]]},"location":"Los Angeles, CA, USA","end":{"date-parts":[[2017,4,12]]}},"container-title":["2017 IEEE 12th International Conference on Nano\/Micro Engineered and Molecular Systems (NEMS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8012169\/8016956\/08017049.pdf?arnumber=8017049","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,9,7]],"date-time":"2017-09-07T00:46:56Z","timestamp":1504745216000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8017049\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/nems.2017.8017049","relation":{},"subject":[],"published":{"date-parts":[[2017,4]]}}}