{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T07:52:54Z","timestamp":1761897174457},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/nems.2019.8915597","type":"proceedings-article","created":{"date-parts":[[2019,11,29]],"date-time":"2019-11-29T09:44:41Z","timestamp":1575020681000},"page":"33-38","source":"Crossref","is-referenced-by-count":4,"title":["Investigating the Effects of Electron Beam Irradiation on Nanoscale Adhesion"],"prefix":"10.1109","author":[{"given":"Soren","family":"Zimmermann","sequence":"first","affiliation":[]},{"given":"Han","family":"Huang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1116\/1.5006161"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1021\/nn402485n"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4945995"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.80.193406"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1039\/C7NR09423J"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1177\/0278364908097584"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.1143970"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-5729(99)00003-5"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1038\/353239a0"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0006-3495(91)82180-4"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2014.2361271"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA.2015.7139291"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/acsphotonics.6b00812"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/NEMS.2016.7758248"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/15599612.2013.879501"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2012.6385474"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2010.2065236"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/27\/28\/28LT01"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2016.2533636"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.1971.0141"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1006\/jcis.1998.6027"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/0021-9797(75)90018-1"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.83.3328"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/0004-637X\/812\/1\/67"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.1995.526162"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.4862897"}],"event":{"name":"2019 IEEE 14th International Conference on Nano\/Micro Engineered and Molecular Systems (NEMS)","start":{"date-parts":[[2019,4,11]]},"location":"Bangkok, Thailand","end":{"date-parts":[[2019,4,14]]}},"container-title":["2019 IEEE 14th International Conference on Nano\/Micro Engineered and Molecular Systems (NEMS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8907345\/8915582\/08915597.pdf?arnumber=8915597","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T10:46:55Z","timestamp":1658141215000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8915597\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/nems.2019.8915597","relation":{},"subject":[],"published":{"date-parts":[[2019,4]]}}}