{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T10:42:34Z","timestamp":1730284954874,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/nems.2019.8915625","type":"proceedings-article","created":{"date-parts":[[2019,11,29]],"date-time":"2019-11-29T09:44:41Z","timestamp":1575020681000},"page":"304-307","source":"Crossref","is-referenced-by-count":0,"title":["Thermal Parameters Determination Through Thermoreflectance Measurements and Analysis"],"prefix":"10.1109","author":[{"given":"Elie","family":"BADINE","sequence":"first","affiliation":[]},{"given":"Mathieu","family":"BARDOUX","sequence":"additional","affiliation":[]},{"given":"Nadine","family":"ABBOUD","sequence":"additional","affiliation":[]},{"given":"Ziad","family":"HERRO","sequence":"additional","affiliation":[]},{"given":"Abdelhak","family":"HADJ SAHRAOUI","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.3212673"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.1819431"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1023\/A:1022586032424"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.2937458"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.3289907"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/6\/1\/006"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.364329"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ab0ac7"},{"key":"ref7","doi-asserted-by":"crossref","DOI":"10.1063\/1.3702823","article-title":"Analysis of Thermal insulating layer on a conducting substrate","volume":"111","author":"fr\u00e9tigny","year":"2012","journal-title":"J Appl Phys"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.329451"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10765-005-2365-z"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1524305"}],"event":{"name":"2019 IEEE 14th International Conference on Nano\/Micro Engineered and Molecular Systems (NEMS)","start":{"date-parts":[[2019,4,11]]},"location":"Bangkok, Thailand","end":{"date-parts":[[2019,4,14]]}},"container-title":["2019 IEEE 14th International Conference on Nano\/Micro Engineered and Molecular Systems (NEMS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8907345\/8915582\/08915625.pdf?arnumber=8915625","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T10:49:29Z","timestamp":1658141369000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8915625\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/nems.2019.8915625","relation":{},"subject":[],"published":{"date-parts":[[2019,4]]}}}