{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T14:19:54Z","timestamp":1725459594172},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/ner.2017.8008328","type":"proceedings-article","created":{"date-parts":[[2017,8,14]],"date-time":"2017-08-14T16:31:32Z","timestamp":1502728292000},"page":"211-214","source":"Crossref","is-referenced-by-count":3,"title":["High-channel-count impedance spectroscopy logger"],"prefix":"10.1109","author":[{"given":"F.","family":"Pothof","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Sharma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"O.","family":"Paul","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Ruther","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1007\/s10439-010-9911-y"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1088\/1741-2560\/1\/4\/005"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1088\/0967-3334\/29\/6\/S23"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1002\/pssa.201001199"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1088\/0964-1726\/18\/5\/055001"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/S0165-0270(98)00031-4"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1006\/exnr.1998.6983"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.3389\/fneng.2014.00002"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.jneumeth.2005.08.015"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.3389\/fnins.2015.00268"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TBME.1977.326115"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1038\/nature11076"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1088\/1741-2560\/8\/2\/025027"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TBME.2005.856245"}],"event":{"name":"2017 8th International IEEE\/EMBS Conference on Neural Engineering (NER)","start":{"date-parts":[[2017,5,25]]},"location":"Shanghai, China","end":{"date-parts":[[2017,5,28]]}},"container-title":["2017 8th International IEEE\/EMBS Conference on Neural Engineering (NER)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8003578\/8008262\/08008328.pdf?arnumber=8008328","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T15:23:44Z","timestamp":1513178624000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8008328\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ner.2017.8008328","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}