{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T22:14:09Z","timestamp":1725488049319},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1109\/newcas.2012.6328990","type":"proceedings-article","created":{"date-parts":[[2012,10,16]],"date-time":"2012-10-16T15:06:26Z","timestamp":1350399986000},"page":"197-200","source":"Crossref","is-referenced-by-count":4,"title":["Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE)"],"prefix":"10.1109","author":[{"given":"Florence","family":"Azais","sequence":"first","affiliation":[]},{"given":"Laurent","family":"Latorre","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670860"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.143"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512782"},{"key":"1","first-page":"17","article-title":"Production test challenges for highly integrated mobile phone SoCs - A case study","author":"poehl","year":"2010","journal-title":"Proc IEEE Eur Test Symp"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.22"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775977"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512617"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.56"},{"article-title":"Analog to digital signal conversion method and apparatus","year":"0","author":"rivoir","key":"8"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2010.5503013"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2011.5981317"}],"event":{"name":"2012 IEEE 10th International New Circuits and Systems Conference (NEWCAS)","start":{"date-parts":[[2012,6,17]]},"location":"Montreal, QC, Canada","end":{"date-parts":[[2012,6,20]]}},"container-title":["10th IEEE International NEWCAS Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6324002\/6328940\/06328990.pdf?arnumber=6328990","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T18:02:56Z","timestamp":1490119376000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6328990\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/newcas.2012.6328990","relation":{},"subject":[],"published":{"date-parts":[[2012,6]]}}}