{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T03:55:28Z","timestamp":1725422128389},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,6]]},"DOI":"10.1109\/newcas.2013.6573648","type":"proceedings-article","created":{"date-parts":[[2013,8,14]],"date-time":"2013-08-14T12:20:36Z","timestamp":1376482836000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A fast reliability-aware approach for analogue integrated circuits based on Pareto fronts"],"prefix":"10.1109","author":[{"given":"Hao","family":"Cai","sequence":"first","affiliation":[]},{"given":"Herve","family":"Petit","sequence":"additional","affiliation":[]},{"given":"Jean-Francois","family":"Naviner","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"International Technology Roadmap for Semiconductors","year":"2009","key":"13"},{"key":"11","article-title":"A statistical method for transistor ageing and process variation applied to reliability simulation","author":"cai","year":"2012","journal-title":"Proc 3rd European Workshop on CMOS Variability"},{"journal-title":"ELDO User Manual","year":"1999","key":"12"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2062870"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEPM.2005.856534"},{"key":"1","first-page":"1","article-title":"Stochastic circuit reliability analysis","author":"maricau","year":"2011","journal-title":"Proc Design Automation and Test Eur Conf and Exhibition (DATE)"},{"journal-title":"NIST\/SEMATECH e-Handbook of Statistical Methods","year":"0","key":"10"},{"journal-title":"Genetic Algorithms in Search Optimization and Machine Learning","year":"1989","author":"goldberg","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146921"},{"key":"4","first-page":"607","article-title":"Optimization of sc ?? modulators based on worst-case-aware pareto-optimal fronts","author":"zou","year":"2007","journal-title":"Proc Custom Integrated Circuits Conference (CICC)"},{"journal-title":"BSIM4 Homepage Version 4 7","year":"2012","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2010.2059031"}],"event":{"name":"2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS)","start":{"date-parts":[[2013,6,16]]},"location":"Paris, France","end":{"date-parts":[[2013,6,19]]}},"container-title":["2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6568396\/6573561\/06573648.pdf?arnumber=6573648","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T17:25:03Z","timestamp":1490203503000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6573648\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,6]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/newcas.2013.6573648","relation":{},"subject":[],"published":{"date-parts":[[2013,6]]}}}