{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T17:37:49Z","timestamp":1725557869397},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,6]]},"DOI":"10.1109\/newcas.2013.6573650","type":"proceedings-article","created":{"date-parts":[[2013,8,14]],"date-time":"2013-08-14T16:20:36Z","timestamp":1376497236000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Selective hardening against multiple faults employing a net-based reliability analysis"],"prefix":"10.1109","author":[{"given":"Samuel N.","family":"Pagliarini","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lirida A.","family":"de B. Naviner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Francois","family":"Naviner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2008.4616787"},{"key":"14","first-page":"663","article-title":"A neutral netlist of 10 combinational benchmark circuits and a target translator in fortran","author":"brglez","year":"1985","journal-title":"Proc Int Symp Circuits and Systems"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.120"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.07.002"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2061131"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.855790"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.30"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2096433"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2011.5958246"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2168239"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.47"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2012.6261262"},{"key":"8","first-page":"1","article-title":"Reliability analysis based on significance","author":"naviner de l b","year":"2011","journal-title":"Argentine School of Micro-Nanoelectronics Technology and Applications (EAMTA 2009)"}],"event":{"name":"2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS)","start":{"date-parts":[[2013,6,16]]},"location":"Paris, France","end":{"date-parts":[[2013,6,19]]}},"container-title":["2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6568396\/6573561\/06573650.pdf?arnumber=6573650","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T21:29:03Z","timestamp":1490218143000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6573650\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,6]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/newcas.2013.6573650","relation":{},"subject":[],"published":{"date-parts":[[2013,6]]}}}