{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,14]],"date-time":"2026-09-14T12:13:05Z","timestamp":1789387985593,"version":"build-2803163510"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1109\/newcas.2014.6933999","type":"proceedings-article","created":{"date-parts":[[2014,11,1]],"date-time":"2014-11-01T00:44:26Z","timestamp":1414802666000},"page":"125-128","source":"Crossref","is-referenced-by-count":5,"title":["Compact modeling and electro-thermal simulation of hot carriers effect in analog circuits"],"prefix":"10.1109","author":[{"given":"Maroua","family":"Garci","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jean-Baptiste","family":"Kammerer","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Luc","family":"Hebrard","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"19","author":"krencker","year":"2012","journal-title":"Electrothermal High-Level Modeling of Integrated Circuits"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1016\/0031-8914(67)90062-6"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2009.5290449"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/EDL.1984.25865"},{"key":"16","first-page":"61","author":"sze","year":"1981","journal-title":"Physics of Semiconductor Devices"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.911419"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/16.944205"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2008.03.017"},{"key":"12","doi-asserted-by":"crossref","first-page":"718","DOI":"10.1109\/IEDM.1987.191531","article-title":"the impact of gate-induced drain leakage current on mosfet scaling","author":"chan","year":"1987","journal-title":"1987 International Electron Devices Meeting"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1985.21952"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1063\/1.338388"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/EDL.1984.25829"},{"key":"10","article-title":"3D electrothermal simulation of analog ICs carried out with standard CAD tolls and Verilog-A","author":"krencker","year":"2011","journal-title":"17th International Work-shop on Thermal Investigations of ICs and Systems"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/55.215189"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.1989.39292"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/16.3354"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1984.21698"},{"key":"9","article-title":"Direct Electro-thermal Simulation of Integrated Circuits using standar CAD tools","author":"krencker","year":"2010","journal-title":"16th International Work-shop on Thermal Investigations of ICs and Systems"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/THERMINIC.2013.6675213"}],"event":{"name":"2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS)","location":"Trois-Rivieres, QC, Canada","start":{"date-parts":[[2014,6,22]]},"end":{"date-parts":[[2014,6,25]]}},"container-title":["2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6919808\/6933969\/06933999.pdf?arnumber=6933999","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T19:26:05Z","timestamp":1498159565000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6933999\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/newcas.2014.6933999","relation":{},"subject":[],"published":{"date-parts":[[2014,6]]}}}