{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T01:10:53Z","timestamp":1725412253646},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/newcas.2015.7182104","type":"proceedings-article","created":{"date-parts":[[2015,8,13]],"date-time":"2015-08-13T12:22:41Z","timestamp":1439468561000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Balancing test cost reduction vs. measurements accuracy at test time"],"prefix":"10.1109","author":[{"given":"Matthieu","family":"Verdy","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dominique","family":"Morche","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Emeric","family":"De Foucauld","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Suzanne","family":"Lesecq","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Pascal","family":"Mallet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cedric","family":"Mayor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CIVEMSA.2014.6841438"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/ip-g-1.1987.0039"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2016136"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0022-460X(02)01441-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/66.29679"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/59.65920"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2014.6934006"}],"event":{"name":"2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)","start":{"date-parts":[[2015,6,7]]},"location":"Grenoble, France","end":{"date-parts":[[2015,6,10]]}},"container-title":["2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7157844\/7181973\/07182104.pdf?arnumber=7182104","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:31:55Z","timestamp":1490387515000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7182104\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/newcas.2015.7182104","relation":{},"subject":[],"published":{"date-parts":[[2015,6]]}}}