{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T09:02:23Z","timestamp":1725786143954},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,6]]},"DOI":"10.1109\/newcas.2016.7604799","type":"proceedings-article","created":{"date-parts":[[2016,11,1]],"date-time":"2016-11-01T21:56:12Z","timestamp":1478037372000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["A comparative study of body biased time-to-digital converters based on stochastic arbiters and stochastic comparators"],"prefix":"10.1109","author":[{"given":"James S.","family":"Tandon","sequence":"first","affiliation":[]},{"given":"Satoshi","family":"Komatsu","sequence":"additional","affiliation":[]},{"given":"Takahiro J.","family":"Yamaguchi","sequence":"additional","affiliation":[]},{"given":"Kunihiro","family":"Asada","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032276"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2012.6330576"},{"journal-title":"Analysis and Design of Analog Integrated Circuits","year":"1993","author":"gray","key":"ref10"},{"key":"ref6","article-title":"A stochastic sampling time-to-digital converter with tunable 180-770fs resolution, inl less than 0.6 LSB, and selectable dynamic range offset","author":"tandon","year":"2013","journal-title":"Proc IEEE Custom Integrated Circuits Conf"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1077603.1077611"},{"key":"ref5","first-page":"527","article-title":"CMOS flash TDC with 0.84-1.3ps resolution using standard cells","author":"yamaguchi","year":"2012","journal-title":"Proc IEEE Radio Frequency Integrated Circuits Symp"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.25"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803949"},{"key":"ref7","first-page":"1","article-title":"A phase-to-digital converter for wide tuning range and pvt tolerant adpll operating down to 0.3v","author":"hayashi","year":"2010","journal-title":"Proc IEEE Asian Solid-State Circuits Conference"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2010109"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.912137"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.38"}],"event":{"name":"2016 14th IEEE International New Circuits and Systems Conference (NEWCAS)","start":{"date-parts":[[2016,6,26]]},"location":"Vancouver, BC, Canada","end":{"date-parts":[[2016,6,29]]}},"container-title":["2016 14th IEEE International New Circuits and Systems Conference (NEWCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7589473\/7604733\/07604799.pdf?arnumber=7604799","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,11,16]],"date-time":"2016-11-16T14:40:25Z","timestamp":1479307225000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7604799\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,6]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/newcas.2016.7604799","relation":{},"subject":[],"published":{"date-parts":[[2016,6]]}}}