{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T23:53:57Z","timestamp":1762300437394,"version":"3.37.3"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T00:00:00Z","timestamp":1687737600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T00:00:00Z","timestamp":1687737600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,26]]},"DOI":"10.1109\/newcas57931.2023.10198076","type":"proceedings-article","created":{"date-parts":[[2023,8,7]],"date-time":"2023-08-07T17:49:33Z","timestamp":1691430573000},"page":"1-5","source":"Crossref","is-referenced-by-count":5,"title":["Technology-Aware Drift Resilience Analysis of RRAM Crossbar Array Configurations"],"prefix":"10.1109","author":[{"given":"Daniel","family":"Reiser","sequence":"first","affiliation":[{"name":"BTU Cottbus-Senftenberg,Cottbus,Germany,03046"}]},{"given":"Marc","family":"Reichenbach","sequence":"additional","affiliation":[{"name":"BTU Cottbus-Senftenberg,Cottbus,Germany,03046"}]},{"given":"Tommaso","family":"Rizzi","sequence":"additional","affiliation":[{"name":"IHP – Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany,15236"}]},{"given":"Andrea","family":"Baroni","sequence":"additional","affiliation":[{"name":"BTU Cottbus-Senftenberg,Cottbus,Germany,03046"}]},{"given":"Markus","family":"Fritscher","sequence":"additional","affiliation":[{"name":"BTU Cottbus-Senftenberg,Cottbus,Germany,03046"}]},{"given":"Christian","family":"Wenger","sequence":"additional","affiliation":[{"name":"BTU Cottbus-Senftenberg,Cottbus,Germany,03046"}]},{"given":"Cristian","family":"Zambelli","sequence":"additional","affiliation":[{"name":"Universita degli Studi di Ferrara,Dipartimento di Ingegneria,Ferrara,Italy,44122"}]},{"given":"Davide","family":"Bertozzi","sequence":"additional","affiliation":[{"name":"Universita degli Studi di Ferrara,Dipartimento di Ingegneria,Ferrara,Italy,44122"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/DFT56152.2022.9962345"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/IEDM.2017.8268340"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/IEDM.2017.8268522"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/LED.2020.2986889"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/IIRW53245.2021.9635613"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TED.2015.2477135"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1088\/1361-6641\/abf29d"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.3389\/fnins.2022.932270"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.23919\/DATE54114.2022.9774749","article-title":"SySCIM: SystemC-AMS sim-ulation of memristive computation in-memory","author":"shadmehri","year":"2022","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1063\/1.5143815"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/TDMR.2022.3182133"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/ICMTS.2014.6841463"},{"key":"ref19","article-title":"Fashion-mnist: a novel image dataset for benchmarking machine learning algorithms","author":"xiao","year":"2017","journal-title":"CoRR"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/5.726791"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/IEDM19573.2019.8993482"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TCSI.2016.2529279"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/MM.2021.3131114"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/AICAS51828.2021.9458494"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TCAD.2018.2789723"},{"key":"ref6","article-title":"Char-acterization and mitigation of relaxation effects on multi-level RRAM based in-memory computing","author":"he","year":"2021","journal-title":"Proc IEEE Int Reliability Physics Symp (IRPS)"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.neucom.2022.02.043"}],"event":{"name":"2023 21st IEEE Interregional NEWCAS Conference (NEWCAS)","start":{"date-parts":[[2023,6,26]]},"location":"Edinburgh, United Kingdom","end":{"date-parts":[[2023,6,28]]}},"container-title":["2023 21st IEEE Interregional NEWCAS Conference (NEWCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10198027\/10198028\/10198076.pdf?arnumber=10198076","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,25]],"date-time":"2024-10-25T20:53:38Z","timestamp":1729889618000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10198076\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,26]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/newcas57931.2023.10198076","relation":{},"subject":[],"published":{"date-parts":[[2023,6,26]]}}}