{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,9]],"date-time":"2026-09-09T05:07:48Z","timestamp":1788930468672,"version":"build-2803163510"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1109\/newcas64543.2026.11674013","type":"proceedings-article","created":{"date-parts":[[2026,9,8]],"date-time":"2026-09-08T19:06:51Z","timestamp":1788894411000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Quantization Noise and DAC Errors Cancellation for Nonlinearity Characterization of Sigma Delta Modulators"],"prefix":"10.1109","author":[{"given":"Leonardo","family":"Papale","sequence":"first","affiliation":[{"name":"Eindhoven University of Technology","place":["Eindhoven, The Netherlands"],"department":["Department of Electrical Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Stijn","family":"Ringeling","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology","place":["Eindhoven, The Netherlands"],"department":["Department of Electrical Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Marco","family":"Fattori","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology","place":["Eindhoven, The Netherlands"],"department":["Department of Electrical Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Robert","family":"Rutten","sequence":"additional","affiliation":[{"name":"NXP Semiconductors","place":["Eindhoven, The Netherlands"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shagun","family":"Bajoria","sequence":"additional","affiliation":[{"name":"NXP Semiconductors","place":["Eindhoven, The Netherlands"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lucien J.","family":"Breems","sequence":"additional","affiliation":[{"name":"NXP Semiconductors","place":["Eindhoven, The Netherlands"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Eugenio","family":"Cantatore","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology","place":["Eindhoven, The Netherlands"],"department":["Department of Electrical Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-66565-8_3"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2007.905390"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/iscas46773.2023.10181538"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2010.5537136"},{"issue":"8","key":"ref5","article-title":"Taking the mystery out of the infamous formula,\u201d snr= 6.02 n+ 1.76 db,\u201d and why you should care","volume":"10","author":"Kester","year":"2009","journal-title":"Analog Devices Tutorial, MT-001 Rev. A"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2014.6865238"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/iscas56072.2025.11044157"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2025.3594847"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2019.2921777"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/jetcas.2015.2502160"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/82.476173"},{"key":"ref12","doi-asserted-by":"crossref","article-title":"Delta sigma toolbox","author":"Schreier","DOI":"10.1002\/9781119258308.app2"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2022.3204871"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2016.2542200"}],"event":{"name":"2026 24nd IEEE Interregional NEWCAS Conference (NEWCAS)","location":"Chicoutimi, QC, Canada","start":{"date-parts":[[2026,6,21]]},"end":{"date-parts":[[2026,6,24]]}},"container-title":["2026 24nd IEEE Interregional NEWCAS Conference (NEWCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11673944\/11673925\/11674013.pdf?arnumber=11674013","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,9,9]],"date-time":"2026-09-09T04:24:54Z","timestamp":1788927894000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11674013\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/newcas64543.2026.11674013","relation":{},"subject":[],"published":{"date-parts":[[2026,6]]}}}