{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,3]],"date-time":"2025-12-03T17:59:33Z","timestamp":1764784773778},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,23]],"date-time":"2021-10-23T00:00:00Z","timestamp":1634947200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,23]],"date-time":"2021-10-23T00:00:00Z","timestamp":1634947200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,23]],"date-time":"2021-10-23T00:00:00Z","timestamp":1634947200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,23]]},"DOI":"10.1109\/niles53778.2021.9600485","type":"proceedings-article","created":{"date-parts":[[2021,11,18]],"date-time":"2021-11-18T17:22:11Z","timestamp":1637256131000},"page":"113-116","source":"Crossref","is-referenced-by-count":3,"title":["Online Constraints Update Using Machine Learning for Accelerating Hardware Verification"],"prefix":"10.1109","author":[{"given":"Mostafa","family":"AboelMaged","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maggie","family":"Mashaly","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohamed A.","family":"Abd El Ghany","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"207","author":"wang","year":"2018","journal-title":"Accelerating Coverage Directed Test Generation for Functional Verification A Neural Network-based Framework"},{"journal-title":"Optimizing Design Verification using Machine Learning Doing better than Random","year":"2019","author":"hughes","key":"ref11"},{"key":"ref12","article-title":"Machine Learning-Guided Stimulus Generation for Functional Verification","author":"gogri","year":"2020","journal-title":"Design and Verification conference 2020 virtual conference"},{"key":"ref13","article-title":"Simulation Runtime Optimization of Constrained Random Verification using Machine Learning Algorithms","author":"ambalakkat","year":"2019","journal-title":"Design and Verification Conference (DVCON)"},{"key":"ref14","article-title":"Improving Constrained Random Testing by Achieving Simulation Design Goals through Target Functions, Rewinding and Dynamic Seed Manipulation","author":"nelson","year":"2017","journal-title":"Design and Verification Conference"},{"key":"ref4","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4614-0715-7","author":"spear","year":"2012","journal-title":"System Verilog for Verfication A Guide to Learning the Testbench Language Features"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICRC.2017.8123645"},{"journal-title":"Stimulus Optimization In Hardware Verification Using Machine-Learning","year":"2019","author":"gogri","key":"ref6"},{"journal-title":"Electronic Design Automation Synthesis Verification and Test","year":"2009","author":"wang","key":"ref5"},{"key":"ref8","article-title":"Optimizing random test constraints using machine learning algorithms","author":"sokorac","year":"2017","journal-title":"DVCON"},{"journal-title":"IGI Global","article-title":"Machine Learning: Concepts, Methodologies, Tools, and Applications","year":"2011","key":"ref7"},{"journal-title":"Optimising Design Verification Using Machine Learning An Open Source Solution","year":"2020","author":"samhita","key":"ref2"},{"journal-title":"Improving coverage of simulation-based design verification using Machine Learning techniques","year":"2019","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2017.15"}],"event":{"name":"2021 3rd Novel Intelligent and Leading Emerging Sciences Conference (NILES)","start":{"date-parts":[[2021,10,23]]},"location":"Giza, Egypt","end":{"date-parts":[[2021,10,25]]}},"container-title":["2021 3rd Novel Intelligent and Leading Emerging Sciences Conference (NILES)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9600478\/9600086\/09600485.pdf?arnumber=9600485","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,12]],"date-time":"2023-11-12T16:19:02Z","timestamp":1699805942000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9600485\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,23]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/niles53778.2021.9600485","relation":{},"subject":[],"published":{"date-parts":[[2021,10,23]]}}}