{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T08:05:49Z","timestamp":1725609949855},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,22]],"date-time":"2022-10-22T00:00:00Z","timestamp":1666396800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,22]],"date-time":"2022-10-22T00:00:00Z","timestamp":1666396800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,22]]},"DOI":"10.1109\/niles56402.2022.9942438","type":"proceedings-article","created":{"date-parts":[[2022,11,14]],"date-time":"2022-11-14T17:01:26Z","timestamp":1668445286000},"page":"256-259","source":"Crossref","is-referenced-by-count":0,"title":["Effect of Transient Failures on FPGA-based Heterogeneous Multicore System Scheduling"],"prefix":"10.1109","author":[{"given":"Kareem","family":"Alansary","sequence":"first","affiliation":[{"name":"The American University in Cairo,Cairo,Egypt"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hassanein","family":"Amer","sequence":"additional","affiliation":[{"name":"The American University in Cairo,Cairo,Egypt"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cherif","family":"Salama","sequence":"additional","affiliation":[{"name":"The American University in Cairo, Ain Shams University,Faculty of Engineering,Cairo,Egypt"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2009.5272313"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2012.6412152"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/358274.358283"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MECO55406.2022.9797101"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-18991-2_27"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2003.1281354"},{"key":"ref12","article-title":"Single-event characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under heavy ion irradiation","author":"lee","year":"2014","journal-title":"IEEE Radiation Effects Data Workshop REDW-02"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1017\/9781316163047"},{"key":"ref7","article-title":"Reliable Computer Systems Design and Evaluation","author":"siewiorek","year":"1998","journal-title":"A K Peters Natick Massachusetts"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2022.104614"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-2113-9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0022-0000(75)80008-0"}],"event":{"name":"2022 4th Novel Intelligent and Leading Emerging Sciences Conference (NILES)","start":{"date-parts":[[2022,10,22]]},"location":"Giza, Egypt","end":{"date-parts":[[2022,10,24]]}},"container-title":["2022 4th Novel Intelligent and Leading Emerging Sciences Conference (NILES)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9942273\/9942362\/09942438.pdf?arnumber=9942438","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T14:55:32Z","timestamp":1670856932000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9942438\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,22]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/niles56402.2022.9942438","relation":{},"subject":[],"published":{"date-parts":[[2022,10,22]]}}}