{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T23:25:50Z","timestamp":1780356350152,"version":"3.54.1"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T00:00:00Z","timestamp":1730160000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T00:00:00Z","timestamp":1730160000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,29]]},"DOI":"10.1109\/norcas64408.2024.10752481","type":"proceedings-article","created":{"date-parts":[[2024,11,18]],"date-time":"2024-11-18T18:51:05Z","timestamp":1731955865000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Radiation-Hardening-by-Design Triple Modular Redundancy Flip-Flop with Self-Correction"],"prefix":"10.1109","author":[{"given":"Oliver","family":"Schrape","sequence":"first","affiliation":[{"name":"IHP GmbH – Leibniz Institute for High Performance Microelectronics,Frankfurt Oder,Germany,15236"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Anselm","family":"Breitenreiter","sequence":"additional","affiliation":[{"name":"IHP GmbH – Leibniz Institute for High Performance Microelectronics,Frankfurt Oder,Germany,15236"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Li","family":"Lu","sequence":"additional","affiliation":[{"name":"IHP GmbH – Leibniz Institute for High Performance Microelectronics,Frankfurt Oder,Germany,15236"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Marko","family":"Andjelkovi\u0107","sequence":"additional","affiliation":[{"name":"IHP GmbH – Leibniz Institute for High Performance Microelectronics,Frankfurt Oder,Germany,15236"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ernesto","family":"Pun-Garcia","sequence":"additional","affiliation":[{"name":"Arquimea Research Center,Torrejón de Ardoz,Spain,28850"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Marisa","family":"L\u00f3pez-Vallejo","sequence":"additional","affiliation":[{"name":"Universidad Politécnica de Madrid,IPTC, ETSI Telecomunicación,Madrid,Spain,28040"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Milo\u0161","family":"Krsti\u0107","sequence":"additional","affiliation":[{"name":"IHP GmbH – Leibniz Institute for High Performance Microelectronics,Frankfurt Oder,Germany,15236"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840850"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/BEC.2018.8600987"},{"key":"ref3","article-title":"Physical and Silicon Measures of Low Power Clock Gating Success: An Apple to Apple Case Study","author":"Pokhrel","year":"2007","journal-title":"SNUG"},{"key":"ref4","first-page":"4","article-title":"A Self-Correcting Soft Error Tolerant Flip-Flop","volume-title":"12th NASA Symposium on VLSI Design","author":"Drake"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2009.5994697"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2017.8696212"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2015.65"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DSD51259.2020.00101"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS51355.2021.9459134"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3109080"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MIEL52794.2021.9569065"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2006.884968"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910126"},{"key":"ref14","article-title":"Research on ADC Architectures Suitable for Space Applications and Technology Scaling","volume-title":"International Workshop on Analogue and Mixed-Signal Integrated Circuits for Space Applications (AMICSA)","author":"Garcia"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS58620.2023.10335985"}],"event":{"name":"2024 IEEE Nordic Circuits and Systems Conference (NorCAS)","location":"Lund, Sweden","start":{"date-parts":[[2024,10,29]]},"end":{"date-parts":[[2024,10,30]]}},"container-title":["2024 IEEE Nordic Circuits and Systems Conference (NorCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10752391\/10752437\/10752481.pdf?arnumber=10752481","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T17:36:50Z","timestamp":1732729010000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10752481\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,29]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/norcas64408.2024.10752481","relation":{},"subject":[],"published":{"date-parts":[[2024,10,29]]}}}