{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T16:56:36Z","timestamp":1725382596159},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/nvmts.2015.7457476","type":"proceedings-article","created":{"date-parts":[[2016,4,25]],"date-time":"2016-04-25T17:45:12Z","timestamp":1461606312000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions"],"prefix":"10.1109","author":[{"given":"Alessandro","family":"Grossi","sequence":"first","affiliation":[]},{"given":"Cristian","family":"Zambelli","sequence":"additional","affiliation":[]},{"given":"Piero","family":"Olivo","sequence":"additional","affiliation":[]},{"given":"Jeremy","family":"Alvarez-Herault","sequence":"additional","affiliation":[]},{"given":"Ken","family":"Mackay","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/INTMAG.2006.376118"},{"key":"ref11","first-page":"39","article-title":"Performance characterization of TAS-MRAM architectures in presence of capacitive defects","author":"azevedo","year":"2013","journal-title":"Int Conf on Advances in System Testing and Validation Lifecycle"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2015.7127367"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/NVSMW.2008.20"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724549"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.1667413"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2014.7038588"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/46\/7\/074002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2294080"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0953-8984\/19\/16\/165218"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.830395"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ReCoSoC.2014.6861357"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTSA.2005.1497086"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2010.5488401"}],"event":{"name":"2015 15th Non-Volatile Memory Technology Symposium (NVMTS)","start":{"date-parts":[[2015,10,12]]},"location":"Beijing","end":{"date-parts":[[2015,10,14]]}},"container-title":["2015 15th Non-Volatile Memory Technology Symposium (NVMTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7451913\/7457421\/07457476.pdf?arnumber=7457476","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T12:57:05Z","timestamp":1489755425000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7457476\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/nvmts.2015.7457476","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}