{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T07:09:15Z","timestamp":1761808155856},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,8]]},"DOI":"10.1109\/nvmts.2017.8171304","type":"proceedings-article","created":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T14:38:53Z","timestamp":1513175933000},"page":"1-8","source":"Crossref","is-referenced-by-count":13,"title":["Endurance prediction and error Reduction in NAND flash using machine learning"],"prefix":"10.1109","author":[{"given":"Barry","family":"Fitzgerald","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Damien","family":"Hogan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Conor","family":"Ryan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joe","family":"Sullivan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1504\/IJCISTUDIES.2014.058644"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/72.914517"},{"journal-title":"e1071 Misc Functions of the Department of Statistics Probability Theory Group (Formerly E1071) TU Wien","year":"2017","author":"meyer","key":"ref12"},{"journal-title":"R A Language and Environment for Statistical Computing","year":"2013","key":"ref13"},{"journal-title":"Solid State Drive (SSD) Requirements and Endurance Test Method","year":"2011","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2015.7150301"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1740390.1740402"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669118"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1109\/RELPHY.2008.4558857","article-title":"Bit error rate in NAND Flash memories","author":"mielke","year":"2008","journal-title":"Reliability Physics Symposium 2008 IRPS 2008 IEEE International"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-37207-0_22"},{"key":"ref2","article-title":"On the use of strong bch codes for improving multilevel nand flash memory storage capacity","author":"sun","year":"2006","journal-title":"IEEE Workshop on Signal Processing Systems (SiPS) Design and Implementation"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176524"},{"key":"ref9","first-page":"67","article-title":"Flash reliability in production: The expected and the unexpected","author":"schroeder","year":"2016","journal-title":"14th USENIX Conference on File and Storage Technologies (FAST 16)"}],"event":{"name":"2017 17th Non-Volatile Memory Technology Symposium (NVMTS)","start":{"date-parts":[[2017,8,30]]},"location":"Aachen","end":{"date-parts":[[2017,9,1]]}},"container-title":["2017 17th Non-Volatile Memory Technology Symposium (NVMTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8124862\/8171277\/08171304.pdf?arnumber=8171304","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,7]],"date-time":"2019-10-07T20:17:33Z","timestamp":1570479453000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8171304\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/nvmts.2017.8171304","relation":{},"subject":[],"published":{"date-parts":[[2017,8]]}}}