{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T03:20:39Z","timestamp":1776482439299,"version":"3.51.2"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/nvmts47818.2019.9043369","type":"proceedings-article","created":{"date-parts":[[2020,3,24]],"date-time":"2020-03-24T03:39:37Z","timestamp":1585021177000},"page":"1-5","source":"Crossref","is-referenced-by-count":18,"title":["True random number generation exploiting SET voltage variability in resistive RAM memory arrays"],"prefix":"10.1109","author":[{"given":"Jeremy","family":"Postel-Pellerin","sequence":"first","affiliation":[{"name":"Aix-Marseille Univ, Univ Toulon, CNRS, IM2NP, Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hussein","family":"Bazzi","sequence":"additional","affiliation":[{"name":"Aix-Marseille Univ, Univ Toulon, CNRS, IM2NP, Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hassen","family":"Aziza","sequence":"additional","affiliation":[{"name":"Aix-Marseille Univ, Univ Toulon, CNRS, IM2NP, Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pierre","family":"Canet","sequence":"additional","affiliation":[{"name":"Aix-Marseille Univ, Univ Toulon, CNRS, IM2NP, Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mathieu","family":"Moreau","sequence":"additional","affiliation":[{"name":"Aix-Marseille Univ, Univ Toulon, CNRS, IM2NP, Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincenzo Della","family":"Marca","sequence":"additional","affiliation":[{"name":"Aix-Marseille Univ, Univ Toulon, CNRS, IM2NP, Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adnan","family":"Harb","sequence":"additional","affiliation":[{"name":"The International University of Beirut, Department of Electrical and\nElectronics Engineering, Beirut, Lebanon"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2019 19th Non-Volatile Memory Technology Symposium (NVMTS)","location":"Durham, NC, USA","start":{"date-parts":[[2019,10,28]]},"end":{"date-parts":[[2019,10,30]]}},"container-title":["2019 19th Non-Volatile Memory Technology Symposium (NVMTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8979203\/8986154\/09043369.pdf?arnumber=9043369","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,20]],"date-time":"2024-02-20T18:46:55Z","timestamp":1708454815000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9043369\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/nvmts47818.2019.9043369","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}