{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T23:50:34Z","timestamp":1740181834683,"version":"3.37.3"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100004837","name":"Spanish Ministry of Science, Innovation and Universities, the State Research Agency","doi-asserted-by":"publisher","award":["RTI2018-099766-B-I00"],"award-info":[{"award-number":["RTI2018-099766-B-I00"]}],"id":[{"id":"10.13039\/501100004837","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004895","name":"European Social Fund","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004895","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Open J. Circuits Syst."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/ojcas.2021.3099869","type":"journal-article","created":{"date-parts":[[2021,9,13]],"date-time":"2021-09-13T20:44:29Z","timestamp":1631565869000},"page":"587-596","source":"Crossref","is-referenced-by-count":2,"title":["A Test Setup for the Characterization of Lorentz-Force MEMS Magnetometers"],"prefix":"10.1109","volume":"2","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1101-6804","authenticated-orcid":false,"given":"Josep Maria","family":"Sanchez-Chiva","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9849-7868","authenticated-orcid":false,"given":"Juan","family":"Valle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1076-6697","authenticated-orcid":false,"given":"Daniel","family":"Fernandez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5905-9179","authenticated-orcid":false,"given":"Jordi","family":"Madrenas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3390\/s18072111"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2014.2375574"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-013-2034-2"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2012.6411484"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TRANSDUCERS.2011.5969191"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2009.5398216"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.3390\/s131114728"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/Transducers.2013.6626865"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2013.6474210"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2005.1597765"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2747140"},{"key":"ref40","first-page":"1","article-title":"A test setup for the characterization of Lorentz-force MEMS magnetometers","author":"s\u00e1nchez-chiva","year":"2020","journal-title":"Proc IEEE Int Conf Electronics Circuits Syst (ICECS)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/s20216037"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2913459"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/s20205899"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.31438\/trf.hh2014.14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TRANSDUCERS.2017.7994173"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISISS.2017.7935678"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2012.2196493"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2013.2264807"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TRANSDUCERS.2019.8808581"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/FCS.2017.8088942"},{"article-title":"eCompass comparative report: 3-axis & 6-axis eCompass for consumer applications technology and cost review","year":"2015","author":"lahrach","key":"ref4"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2293349"},{"year":"2017","key":"ref3","article-title":"Magnetic sensor. Market and technology report—November 2017"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1155\/2010\/937301"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2016.7421796"},{"key":"ref5","first-page":"101","article-title":"100 nT\/?Hz, 0.5 mm² monolithic, multi-loop low-power 3-axis MEMS magnetometer","author":"marra","year":"2018","journal-title":"Proc IEEE Micro Electro Mech Syst (MEMS)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/el.2015.0140"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3086867"},{"year":"2014","key":"ref2","article-title":"6- & 9-axis sensors consumer inertial combos"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2015.7370516"},{"year":"2012","key":"ref1","article-title":"Technology trends for inertial MEMS"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2210958"},{"key":"ref22","first-page":"80","article-title":"Single-structure 3-axis Lorentz force magnetometer with sub-30 nT\/?HZ resolution","author":"li","year":"2014","journal-title":"Proc IEEE 27th Int Conf Micro Electro Mech Syst (MEMS)"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2014.11.275"},{"journal-title":"BUF634 250-mA High-Speed Buffer","year":"2019","key":"ref42"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2015.7051108"},{"journal-title":"Ultrafast 7 ns Single Supply Comparator Rev D","year":"2016","key":"ref41"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2018.2846781"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/26\/10\/105021"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2015.7050922"}],"container-title":["IEEE Open Journal of Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784029\/9314963\/09536262.pdf?arnumber=9536262","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:58:17Z","timestamp":1639771097000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9536262\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/ojcas.2021.3099869","relation":{},"ISSN":["2644-1225"],"issn-type":[{"type":"electronic","value":"2644-1225"}],"subject":[],"published":{"date-parts":[[2021]]}}}