{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T16:11:36Z","timestamp":1782403896792,"version":"3.54.5"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/100000049","name":"National Institute on Aging of the National Institutes of Health","doi-asserted-by":"publisher","award":["R21AG056265"],"award-info":[{"award-number":["R21AG056265"]}],"id":[{"id":"10.13039\/100000049","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Open J. Circuits Syst."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/ojcas.2021.3122369","type":"journal-article","created":{"date-parts":[[2021,11,24]],"date-time":"2021-11-24T20:30:14Z","timestamp":1637785814000},"page":"732-742","source":"Crossref","is-referenced-by-count":12,"title":["Flexible PCB Failures From Dynamic Activity and Their Impacts on Bioimpedance Measurements: A Wearable Case Study"],"prefix":"10.1109","volume":"2","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8888-2452","authenticated-orcid":false,"given":"Shelby","family":"Critcher","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9979-7301","authenticated-orcid":false,"given":"Todd J.","family":"Freeborn","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/SoutheastCon44009.2020.9249690"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2017.10.038"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2016.2628766"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1038\/ejcn.2012.161"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2994552"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2019.2927807"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1088\/2057-1976\/aaea59"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.3390\/s150818102"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-73841-1_171"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.clinph.2015.06.021"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2926841"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/s18072095"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/36\/1\/85"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s18082414"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2014.2309951"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.elstat.2007.11.005"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2970314"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/2057-1976\/aaabed"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/32\/7\/S12"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.jare.2020.05.016"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2020.3027477"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2016.2641958"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10439-009-9654-9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351613"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2011.05.015"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/jsid.242"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1098\/rsif.2019.0217"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2019.111422"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11664-999-0176-x"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1115\/1.1462628"},{"key":"ref17","article-title":"Fatigue behavior of thin Cu foils and Cu\/Kapton flexible circuits","author":"susan","year":"2008"},{"key":"ref18","first-page":"470","article-title":"Life predict and simulation of the copper wire in flexible printed circuit board","volume":"2","author":"wang","year":"2011","journal-title":"Proc 3rd Int Conf Meas Technol Mechatronics Autom"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1155\/2019\/9210258"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3389\/fphys.2016.00071"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1186\/1743-0003-9-21"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/0379-6779(93)90501-M"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/s131014079"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1039\/C8CS00814K"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/s18113775"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2003.820338"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s21051855"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.jelekin.2020.102511"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/34\/2\/237"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1115\/IPACK2020-2644"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ITHERM.2018.8419564"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS48704.2020.9184451"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/s21093013"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/34\/12\/1611"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS51355.2021.9459142"}],"container-title":["IEEE Open Journal of Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784029\/9314963\/09626077.pdf?arnumber=9626077","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,7]],"date-time":"2022-03-07T20:46:49Z","timestamp":1646686009000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9626077\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":49,"URL":"https:\/\/doi.org\/10.1109\/ojcas.2021.3122369","relation":{},"ISSN":["2644-1225"],"issn-type":[{"value":"2644-1225","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}