{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,6]],"date-time":"2025-12-06T16:47:49Z","timestamp":1765039669356,"version":"3.37.3"},"reference-count":64,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"NRF\/F.RS.-FNRS South Africa\u2014Wallonia Joint Science and Technology Research Collaboration","award":["UID107864"],"award-info":[{"award-number":["UID107864"]}]},{"DOI":"10.13039\/501100001321","name":"NRF","doi-asserted-by":"publisher","award":["UID137950"],"award-info":[{"award-number":["UID137950"]}],"id":[{"id":"10.13039\/501100001321","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Open J. Circuits Syst."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/ojcas.2022.3232638","type":"journal-article","created":{"date-parts":[[2022,12,28]],"date-time":"2022-12-28T18:32:56Z","timestamp":1672252376000},"page":"70-84","source":"Crossref","is-referenced-by-count":2,"title":["Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers"],"prefix":"10.1109","volume":"4","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1543-9652","authenticated-orcid":false,"given":"Hendrik P.","family":"Nel","sequence":"first","affiliation":[{"name":"Department for Electrical, Electronic and Computer Engineering, Carl and Emily Fuchs Institute for Microelectronics, University of Pretoria, Pretoria, South Africa"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2889-315X","authenticated-orcid":false,"given":"Fortunato Carlos","family":"Dualibe","sequence":"additional","affiliation":[{"name":"Electronics and Microelectronics Department, Polytechnic Faculty, Université de Mons, Mons, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1600-6135","authenticated-orcid":false,"given":"Tinus","family":"Stander","sequence":"additional","affiliation":[{"name":"Department for Electrical, Electronic and Computer Engineering, Carl and Emily Fuchs Institute for Microelectronics, University of Pretoria, Pretoria, South Africa"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/mcom.2003.1232241"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/arftg.2007.5456327"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2017.01.002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/mdat.2016.2590985"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/mdt.2011.131"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2007.894223"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/82.728852"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/mwsym.2010.5516284"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/vts.2014.6818776"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2005.01.002"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2699837"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/etsym.2010.5512783"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2009.2016136"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/lmwc.2021.3068012"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/icee.2018.8472454"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5534-4"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2007.907232"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.06.077"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/43.644035"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/vtest.1997.600246"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/19.779176"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tsp49548.2020.9163431"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/vts.2018.8368622"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/miel.2017.8190122"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/iscas51556.2021.9401388"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tnano.2013.2251656"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/vtest.1996.510896"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/cae.2019.8709294"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/latw.2018.8349689"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-017-0648-9"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/5075103"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/lascas.2017.7948042"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2009.2031381"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-007-0065-3"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2005.04.061"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2007.01.005"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2008.4541419"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/telsiks52058.2021.9606315"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/isqed.2012.6187467"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/icecs.2018.8618052"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/rfic.2010.5477307"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/icecs.2006.379863"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/bctm.2013.6798176"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/sirf.2012.6160149"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2011.2163953"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2017.2783302"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ets.2013.6569357"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2012.2205027"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/mdt.2012.2205480"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/ets.2011.51"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/test.2010.5699271"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/ets.2012.6233045"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/date.2012.6176730"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2020.3022908"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.3390\/s21030805"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1002\/mmce.22419"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1002\/cta.2772"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/etsym.2010.5512726"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1177\/002072099503200317"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/dtis.2013.6527772"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/ets.2005.22"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/4.553192"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/iddq.1996.557817"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/dtis.2013.6527768"}],"container-title":["IEEE Open Journal of Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784029\/10019301\/10002329.pdf?arnumber=10002329","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,9]],"date-time":"2024-02-09T04:17:46Z","timestamp":1707452266000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10002329\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":64,"URL":"https:\/\/doi.org\/10.1109\/ojcas.2022.3232638","relation":{},"ISSN":["2644-1225"],"issn-type":[{"type":"electronic","value":"2644-1225"}],"subject":[],"published":{"date-parts":[[2023]]}}}