{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,12]],"date-time":"2026-02-12T17:38:25Z","timestamp":1770917905074,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001409","name":"Department of Science and Technology, Ministry of Science and Technology, India","doi-asserted-by":"publisher","award":["DST\/SJF\/ETA02\/2017-18"],"award-info":[{"award-number":["DST\/SJF\/ETA02\/2017-18"]}],"id":[{"id":"10.13039\/501100001409","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Open J. Circuits Syst."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/ojcas.2023.3309478","type":"journal-article","created":{"date-parts":[[2023,8,29]],"date-time":"2023-08-29T17:32:40Z","timestamp":1693330360000},"page":"258-270","source":"Crossref","is-referenced-by-count":8,"title":["Cryogenic In-Memory Computing for Quantum Processors Using Commercial 5-nm FinFETs"],"prefix":"10.1109","volume":"4","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7104-2396","authenticated-orcid":false,"given":"Shivendra Singh","family":"Parihar","sequence":"first","affiliation":[{"name":"Semiconductor Test and Reliability, University of Stuttgart, Stuttgart, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7902-9353","authenticated-orcid":false,"given":"Simon","family":"Thomann","sequence":"additional","affiliation":[{"name":"Semiconductor Test and Reliability, University of Stuttgart, Stuttgart, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2094-858X","authenticated-orcid":false,"given":"Girish","family":"Pahwa","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Sciences, University of California at Berkeley, Berkeley, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3356-8917","authenticated-orcid":false,"given":"Yogesh Singh","family":"Chauhan","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur, India"}]},{"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[{"name":"Semiconductor Test and Reliability, University of Stuttgart, Stuttgart, Germany"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2015.7313897"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2023.3248286"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2274888"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757417"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/WOLTE55422.2022.9882859"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48227.2022.9764594"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062985"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0321-3"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9371912"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2020.2976546"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.86.032324"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.1619152114"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/NANOARCH53687.2021.9642238"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2848999"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VTS50974.2021.9441038"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2022.3223031"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3097971"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CICC53496.2022.9772841"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2903111"},{"key":"ref25","year":"2022","journal-title":"BSIM-CMG Technical Manual"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48227.2022.9764551"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3156165"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2022.3168057"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131495"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2963379"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1063\/1.1726266"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662392"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IWASI.2017.7974215"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401756"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3024678"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevX.2.031007"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-019-1666-5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-00528-y"}],"container-title":["IEEE Open Journal of Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784029\/10019301\/10233878.pdf?arnumber=10233878","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T18:37:49Z","timestamp":1705516669000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10233878\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/ojcas.2023.3309478","relation":{},"ISSN":["2644-1225"],"issn-type":[{"value":"2644-1225","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}