{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T08:01:14Z","timestamp":1772006474620,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Korea Advanced Institute of Science and Technology (KAIST) Jang Young Sil Fellow Program"},{"name":"National Research Foundation of Korea (NRF) Grant"},{"name":"Korean Government","award":["RS-2025-24523215"],"award-info":[{"award-number":["RS-2025-24523215"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Open J. Circuits Syst."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/ojcas.2026.3663446","type":"journal-article","created":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T21:07:08Z","timestamp":1770757628000},"page":"69-81","source":"Crossref","is-referenced-by-count":0,"title":["A SAR-Assisted Continuous-Time M-0 MASH Delta-Sigma Modulator With Digital-Domain Noise Leakage Shaping"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5858-0453","authenticated-orcid":false,"given":"Kent Edrian","family":"Lozada","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2931-1270","authenticated-orcid":false,"given":"Bo","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3510-7741","authenticated-orcid":false,"given":"Raymond","family":"Mabilangan","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5159-1267","authenticated-orcid":false,"given":"Charlie","family":"Tahar","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-7059-074X","authenticated-orcid":false,"given":"Kun-Woo","family":"Park","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-8107-3117","authenticated-orcid":false,"given":"Young-Hun","family":"Moon","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-5739-5873","authenticated-orcid":false,"given":"Kwan-Hoon","family":"Song","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6947-7785","authenticated-orcid":false,"given":"Seung-Tak","family":"Ryu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/OJSSCS.2022.3211482"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/OJSSCS.2024.3472000"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC63670.2025.10983245"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2022298"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2594953"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2778284"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/cicc51472.2021.9431576"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC53895.2021.9634711"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3182406"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/VLSITechnologyandCir57934.2023.10185310"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3391902"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/vlsitechnologyandcir46783.2024.10631347"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/vlsitechnologyandcir46783.2024.10631532"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS53549.2025.11244391"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1990.112045"},{"key":"ref16","first-page":"C64","article-title":"A 66dB SNDR 15MHz BW SAR assisted \u0394\u03a3 ADC in 22nm tri-gate CMOS","volume-title":"Proc. Symp. VLSI Circuits","author":"Lee"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3382007"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2587881"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2894034"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731789"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2466459"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2319994"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3513442"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2571671"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7527544"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2837123"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662371"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401651"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3163766"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2022302"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3299931"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401444"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC67472.2025.11349390"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063026"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2024.3481002"}],"container-title":["IEEE Open Journal of Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8784029\/11367652\/11390665.pdf?arnumber=11390665","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T07:05:04Z","timestamp":1772003104000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11390665\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/ojcas.2026.3663446","relation":{},"ISSN":["2644-1225"],"issn-type":[{"value":"2644-1225","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}