{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,19]],"date-time":"2026-04-19T08:57:25Z","timestamp":1776589045988,"version":"3.51.2"},"reference-count":63,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100002724","name":"Open Access Program at the American University of Sharjah","doi-asserted-by":"publisher","award":["FRG24-C-E66"],"award-info":[{"award-number":["FRG24-C-E66"]}],"id":[{"id":"10.13039\/501100002724","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Open J. Commun. Soc."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/ojcoms.2025.3564069","type":"journal-article","created":{"date-parts":[[2025,4,24]],"date-time":"2025-04-24T17:08:21Z","timestamp":1745514501000},"page":"4036-4050","source":"Crossref","is-referenced-by-count":4,"title":["Tackling the Optimal Phasor Measurement Unit Placement and Attack Detection Problems in Smart Grids by Incorporating Machine Learning"],"prefix":"10.1109","volume":"6","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-8410-083X","authenticated-orcid":false,"given":"Ramzi","family":"Al-Sharawi","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, College of Engineering, American University of Sharjah, Sharjah, UAE"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6616-5452","authenticated-orcid":false,"given":"Abdelfatah","family":"Ali","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, College of Engineering, American University of Sharjah, Sharjah, UAE"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5134-0601","authenticated-orcid":false,"given":"Mostafa","family":"Shaaban","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, College of Engineering, American University of Sharjah, Sharjah, UAE"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2253-994X","authenticated-orcid":false,"given":"Nasser","family":"Qaddoumi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, College of Engineering, American University of Sharjah, Sharjah, UAE"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9197-0306","authenticated-orcid":false,"given":"Mohamed S.","family":"Abdalzaher","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, College of Engineering, American University of Sharjah, Sharjah, UAE"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2018.2802704"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1787\/827374a6-en"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/OJCOMS.2024.3351088"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/OJCOMS.2024.3397044"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2017.2782367"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.SP.1108r3"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2012.6257523"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.2996671"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/OJIA.2024.3365576"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2011.2163807"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/35019019"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2019.107094"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2024.3477269"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106796"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/axioms12111040"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/2701\/1\/012001"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2592102"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICPEE50452.2021.9358489"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.segan.2015.03.002"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2906269"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/PESGM41954.2020.9281963"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/5.0162934"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2012.2191578"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2021.1977428"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2017.2686367"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2021.3099072"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/enc2.12091"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3524097"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1049\/iet-com.2018.6272"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3114420"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2015.2404803"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ELTICOM64085.2024.10865372"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jnca.2024.104034"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/MEPCON63025.2024.10850282"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/SEGE.2019.8859946"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2016.7727361"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/SGC52076.2020.9335732"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.3390\/electricity4020010"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-024-02572-9"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2021.3068390"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-021-07682-3"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2023.3326823"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3117230"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3131506"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13244862"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijcip.2022.100508"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2022.103016"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.35833\/MPCE.2020.000686"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2011.6111219"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.864045"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/59.207352"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/5.824004"},{"key":"ref54","volume-title":"MathWorks\u2014Maker of MATLAB and simulink\u2014MATLAB & simulink","year":"2024"},{"key":"ref55","volume-title":"GAMS\u2014Cutting edge modeling","year":"2024"},{"key":"ref56","volume-title":"Python","year":"2024"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.3390\/app14114764"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1049\/smc2.12084"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1111\/j.1751-5823.2012.00183.x"},{"key":"ref60","article-title":"Evaluation: From precision, recall and F-measure to ROC, informedness, markedness and correlation","author":"Powers","year":"2020","journal-title":"arXiv:2010.16061"},{"key":"ref61","volume-title":"The truth of the f-measure","author":"Sasaki","year":"2007"},{"issue":"3","key":"ref62","first-page":"307","article-title":"Receiver operating characteristic (ROC) methodology: The state of the art","volume":"29","author":"Hanley","year":"1989","journal-title":"Crit Rev Diagn Imag."},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1980.319578"}],"container-title":["IEEE Open Journal of the Communications Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8782661\/10829557\/10975827.pdf?arnumber=10975827","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,13]],"date-time":"2025-05-13T06:10:08Z","timestamp":1747116608000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10975827\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":63,"URL":"https:\/\/doi.org\/10.1109\/ojcoms.2025.3564069","relation":{},"ISSN":["2644-125X"],"issn-type":[{"value":"2644-125X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}