{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,6]],"date-time":"2026-01-06T01:59:26Z","timestamp":1767664766287,"version":"3.37.3"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Open J. Comput. Soc."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/ojcs.2024.3510555","type":"journal-article","created":{"date-parts":[[2024,12,2]],"date-time":"2024-12-02T18:44:17Z","timestamp":1733165057000},"page":"141-152","source":"Crossref","is-referenced-by-count":3,"title":["Enhanced Lithographic Hotspot Detection via Multi-Task Deep Learning With Synthetic Pattern Generation"],"prefix":"10.1109","volume":"6","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-2364-2670","authenticated-orcid":false,"given":"Xinguang","family":"Zhang","sequence":"first","affiliation":[{"name":"The University of Texas at Dallas, Dallas, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shiyang","family":"Chen","sequence":"additional","affiliation":[{"name":"Texas A&M University, College Station, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhouhang","family":"Shao","sequence":"additional","affiliation":[{"name":"University of California, San Diego, San Diego, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-7245-9346","authenticated-orcid":false,"given":"Yongjie","family":"Niu","sequence":"additional","affiliation":[{"name":"Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Fan","sequence":"additional","affiliation":[{"name":"Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/iccad45719.2019.8942128"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2009.5166300"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062270"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD45719.2019.8942128"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2018.8368646"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429457"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2980073"},{"key":"ref8","first-page":"1","article-title":"Fuzzy pattern matching model for lithography hotspot detection","volume-title":"Proc. 2014 IEEE Des., Autom. Test Eur. Conf. Exhib.","author":"Wen","year":"2014"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2164537"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1117\/12.2085790"},{"issue":"8","key":"ref11","first-page":"1679","article-title":"Layout hotspot detection with feature tensor generation and deep biased learning","volume":"37","author":"Yang","year":"2018","journal-title":"IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."},{"issue":"7","key":"ref12","first-page":"1320","article-title":"VIPER: A versatile pattern generator for early design space exploration and late design rule violations","volume":"38","author":"Reddy","year":"2019","journal-title":"IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2011.5722295"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/12.846650"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967032"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287685"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1117\/12.2218540"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1117\/1.JMM.15.2.021009"},{"key":"ref19","first-page":"18","article-title":"A hybrid hotspot library building technique for lithography-friendly layout design","volume-title":"Proc. 23rd Asia South Pacific Des. Automat. Conf.","author":"Chen","year":"2018"},{"issue":"10","key":"ref20","first-page":"1657","article-title":"Parameterized layout synthesis for asic designs","volume":"35","author":"Li","year":"2016","journal-title":"IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."},{"key":"ref21","first-page":"1","article-title":"Machine learning for electronic design automation: A survey","volume-title":"Proc. 57th ACM\/IEEE Des. Automat. Conf.","author":"Wang","year":"2020"},{"issue":"4","key":"ref22","first-page":"721","article-title":"Multi-objective optimization of 3D IC partitioning and through silicon via assignment","volume":"26","author":"Zhang","year":"2018","journal-title":"IEEE Trans. Very Large Scale Integration Syst."},{"key":"ref23","first-page":"1","article-title":"LithoGAN: End-to-end lithography modeling with generative adversarial networks","volume-title":"Proc. 56th Annu. Des. Automat. Conf.","author":"Ye","year":"2019"},{"issue":"12","key":"ref24","first-page":"2502","article-title":"Gan-based efficient and rapid IC design space exploration for performance and reliability optimization","volume":"40","author":"Chen","year":"2021","journal-title":"IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."},{"article-title":"A guide to convolution arithmetic for deep learning","year":"2016","author":"Dumoulin","key":"ref25"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2750068"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317852"}],"container-title":["IEEE Open Journal of the Computer Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8782664\/10834807\/10772617.pdf?arnumber=10772617","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,14]],"date-time":"2025-01-14T05:40:08Z","timestamp":1736833208000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10772617\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/ojcs.2024.3510555","relation":{},"ISSN":["2644-1268"],"issn-type":[{"type":"electronic","value":"2644-1268"}],"subject":[],"published":{"date-parts":[[2025]]}}}