{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T04:41:33Z","timestamp":1725424893162},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2002.1030179","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T18:14:31Z","timestamp":1056564871000},"page":"26-31","source":"Crossref","is-referenced-by-count":1,"title":["Automated synthesis of SEU tolerant architectures from OO descriptions"],"prefix":"10.1109","author":[{"given":"S.","family":"Chiusano","sequence":"first","affiliation":[]},{"given":"S.","family":"Di Carlo","sequence":"additional","affiliation":[]},{"given":"P.","family":"Prinetto","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/24.914544"},{"journal-title":"Software-Implemented Hardware Fault Tolerance Experiments COTS in Space","year":"2000","author":"shirvani","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/40.735941"},{"key":"ref13","first-page":"210","article-title":"Soft-error Detection through Software Fault-Tolerance techniques","author":"rebaudengo","year":"1999","journal-title":"DFT’99 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICDSN.2000.857517"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1992.243568"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/71.774911"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990300"},{"journal-title":"The C++ Programming Language","year":"1991","author":"stroustrup","key":"ref18"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/92.285745"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008244815697"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1994.630021"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.229762"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI.2000.876038"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512675"},{"key":"ref2","first-page":"iii-l","article-title":"Measurement of Single Event Phenomena in Devices and ICs","author":"sexton","year":"1992","journal-title":"IEEE NSREC Short Course"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.1996.495897"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639654"}],"event":{"name":"Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)","acronym":"OLT-02","location":"Isle of Bendor, France"},"container-title":["Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8008\/22136\/01030179.pdf?arnumber=1030179","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T18:32:28Z","timestamp":1489170748000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1030179\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/olt.2002.1030179","relation":{},"subject":[]}}