{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T13:47:14Z","timestamp":1725544034050},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2002.1030181","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T22:14:31Z","timestamp":1056579271000},"page":"39-43","source":"Crossref","is-referenced-by-count":2,"title":["A new self-checking code-disjoint carry-skip adder"],"prefix":"10.1109","author":[{"given":"D.","family":"Marienfeld","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.S.","family":"Sogomonyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Ocheretnij","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Gossel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"556","article-title":"Efficient Implementations of Self-Checking Adders and ALU's","author":"nicolaidis","year":"1993","journal-title":"Symposium on Fault-Tolerant Computing"},{"journal-title":"Error Detection Logic for Digital Computers","year":"1968","author":"sellers","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990310"},{"key":"ref5","first-page":"36","article-title":"New Totally Self-Checking Ripple and Carry Look-ahead Adders","author":"sogomonyan","year":"1997","journal-title":"Proc On-Line Testing Workshop"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2001.937834"},{"journal-title":"Computer Organization and Design","year":"1998","author":"patterson","key":"ref2"},{"journal-title":"Computer Arithmetic Algorithms and Hardware Designs","year":"2000","author":"parhami","key":"ref1"}],"event":{"name":"Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)","acronym":"OLT-02","location":"Isle of Bendor, France"},"container-title":["Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8008\/22136\/01030181.pdf?arnumber=1030181","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T21:22:12Z","timestamp":1489180932000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1030181\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/olt.2002.1030181","relation":{},"subject":[]}}