{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,24]],"date-time":"2024-10-24T04:24:26Z","timestamp":1729743866530,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2002,1,1]],"date-time":"2002-01-01T00:00:00Z","timestamp":1009843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2002,1,1]],"date-time":"2002-01-01T00:00:00Z","timestamp":1009843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2002]]},"DOI":"10.1109\/olt.2002.1030220","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T22:14:31Z","timestamp":1056579271000},"page":"206-210","source":"Crossref","is-referenced-by-count":0,"title":["A BIST-based solution for the diagnosis of embedded memories adopting image processing techniques"],"prefix":"10.1109","author":[{"given":"D.","family":"Appello","sequence":"first","affiliation":[{"name":"STMicroelectronics, Cornaredo, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Fudoli","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Cornaredo, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Tancorre","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Cornaredo, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Corno","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Rebaudengo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Sonza Reorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"97","article-title":"Memory Fault Diagnosis by Sindrome Compression","author":"lu","year":"2001","journal-title":"IEEE Design Automation and Test in Europe"},{"key":"ref11","first-page":"1112","article-title":"Built-In Self-Repair for Embedded High Density SRAM","author":"kim","year":"0"},{"key":"ref12","first-page":"616","article-title":"Towards a Standard for Embedded Core Test: An Ex-ample","author":"marinissen","year":"0"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1987.4767964"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"1076","DOI":"10.1109\/34.166622","article-title":"Shapes Recognition Using Straight Line Hough Transform: Theory and Generalization","volume":"14","author":"derek","year":"1992","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/83.913587"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/12.45207"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/54.748806"},{"key":"ref6","first-page":"61","article-title":"An Optimal March Test for Locating Faults in DRAMs","author":"shen","year":"0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/54.211525"},{"key":"ref8","first-page":"305","article-title":"Diagnostic testing of embedded memories using BIST","author":"bergfeld","year":"0"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1996.782499"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990266"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966631"},{"key":"ref9","first-page":"468","article-title":"Error Catch and Analysis for Semiconductor Memories Using March Tests","author":"wu","year":"0"}],"event":{"name":"Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)","start":{"date-parts":[[2002,7,10]]},"location":"Bendor, France","end":{"date-parts":[[2002,7,10]]}},"container-title":["Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8008\/22136\/01030220.pdf?arnumber=1030220","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T17:46:14Z","timestamp":1729705574000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1030220\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/olt.2002.1030220","relation":{},"subject":[],"published":{"date-parts":[[2002]]}}}