{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T11:18:09Z","timestamp":1730287089482,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2003.1214365","type":"proceedings-article","created":{"date-parts":[[2004,3,2]],"date-time":"2004-03-02T02:26:50Z","timestamp":1078194410000},"page":"43-48","source":"Crossref","is-referenced-by-count":1,"title":["A design method for embedded self-testing t-UED and BUED code checkers"],"prefix":"10.1109","author":[{"given":"S.","family":"Tarnick","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/00207219408925905"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/43.62799"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766689"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1997.628317"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766690"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1155\/1998\/67574"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/43.21840"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/12.485577"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/54.57909"},{"journal-title":"Self-Testing Embedded Checkers for Bose-Lin Bose and A Class of Borden Codes","year":"2002","author":"tarnick","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676768"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1985.1676535"},{"key":"ref6","first-page":"771","article-title":"A Design Method for Cost-Effective Self-Testing Checker for Optimal d-Unidirectional Error Detecting Codes","volume":"e75 d","author":"fujiwara","year":"1992","journal-title":"IEICE Transactions on Information and Systems"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.31530"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1997.568199"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/12.494103"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(82)91125-1"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223705"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/12.475127"}],"event":{"name":"9th International IEEE On-Line Testing Symposium","acronym":"OLT-03","location":"Kos Island, Greece"},"container-title":["9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8615\/27297\/01214365.pdf?arnumber=1214365","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T18:21:51Z","timestamp":1489429311000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1214365\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/olt.2003.1214365","relation":{},"subject":[]}}