{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T16:58:43Z","timestamp":1729616323137,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2003.1214366","type":"proceedings-article","created":{"date-parts":[[2004,3,1]],"date-time":"2004-03-01T21:26:50Z","timestamp":1078176410000},"page":"49-53","source":"Crossref","is-referenced-by-count":4,"title":["Designing FPGA based self-testing checkers for m-out-of-n codes"],"prefix":"10.1109","author":[{"given":"A.","family":"Matrosova","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Ostrovsky","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Levin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Nikitin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"162","article-title":"Design Method of Totally Self-Checking Checkers for m-out-of-n Codes","author":"piestrak","year":"1983","journal-title":"FTCS-13 Dig Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1990.89382"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/00207219408926054"},{"key":"ref6","article-title":"Design of Self-Testing Checkers for Unidirectional Error Detecting Codes","author":"piestrak","year":"1995","journal-title":"Scientific Papers of Inst of Techn Cybern of Techn Univ of Wroclaw"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/12.2167"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/00207219308925825"},{"journal-title":"Self-Checking and Fault Tolerant Digital Design","year":"2001","author":"lala","key":"ref12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/12.403723"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1997.628317"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223705"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/el:19850769"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"7","DOI":"10.1023\/A:1008244815697","article-title":"On-Line Testing for VLSI-A Compendium of Approaches","volume":"12","author":"nicolaidis","year":"1998","journal-title":"Journal of Electronic Testing Theory and Applications"}],"event":{"name":"9th International IEEE On-Line Testing Symposium","acronym":"OLT-03","location":"Kos Island, Greece"},"container-title":["9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8615\/27297\/01214366.pdf?arnumber=1214366","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T00:04:52Z","timestamp":1497571492000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1214366\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/olt.2003.1214366","relation":{},"subject":[]}}