{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T12:12:50Z","timestamp":1742386370261},"reference-count":16,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2003.1214368","type":"proceedings-article","created":{"date-parts":[[2004,3,2]],"date-time":"2004-03-02T02:26:50Z","timestamp":1078194410000},"page":"61-67","source":"Crossref","is-referenced-by-count":11,"title":["Power consumption of fault tolerant codes: the active elements"],"prefix":"10.1109","author":[{"given":"D.","family":"Rossi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.E.S.","family":"van Dijk","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.P.","family":"Kleihorst","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.K.","family":"Nieuwland","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Metra","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Fault Tolerant Computing Theory and Techniques","year":"1986","author":"pradhan","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/92.766748"},{"journal-title":"Error Control Coding for Computer Systems","year":"1989","author":"rao","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2002.1030176"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2000.896493"},{"key":"ref15","article-title":"Transition Pattern Coding: An Approach to Reduce Energy in Interconnect","author":"sotiriadis","year":"2000","journal-title":"ESSCIRC' 2000"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/92.645071"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/92.863617"},{"key":"ref3","article-title":"Power-Optimal Encoding for a DRAM Address Bus","author":"cheng","year":"2002","journal-title":"IEEE Trans on VLSI Systems"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743195"},{"journal-title":"Self-Checking and Fault-Tolerant Digital Design","year":"2001","author":"lala","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743330"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/12.862216"},{"key":"ref2","first-page":"60","article-title":"Implementation and Evaluation of a Soft-Error Detecting Technique","author":"anghel","year":"1999","journal-title":"Proc of 5th IEEE Int On-Line Testing Work"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"2001","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766651"}],"event":{"name":"9th International IEEE On-Line Testing Symposium","acronym":"OLT-03","location":"Kos Island, Greece"},"container-title":["9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8615\/27297\/01214368.pdf?arnumber=1214368","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T18:27:33Z","timestamp":1489429653000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1214368\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/olt.2003.1214368","relation":{},"subject":[]}}