{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:20:46Z","timestamp":1729628446246,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2003.1214373","type":"proceedings-article","created":{"date-parts":[[2004,3,2]],"date-time":"2004-03-02T02:26:50Z","timestamp":1078194410000},"page":"94-98","source":"Crossref","is-referenced-by-count":11,"title":["Memory built-in self-repair for nanotechnologies"],"prefix":"10.1109","author":[{"given":"M.","family":"Nicolaidis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Achouri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Anghel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/4.165332"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1989.56835"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253672"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2000.856639"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.527935"},{"key":"ref8","first-page":"602","article-title":"A BISR (Buil-In Self-Repair) circuit for embedded memory with multiple redundancies","author":"kim","year":"1999","journal-title":"1999 IEEE International Conference on VLSI and CAD"},{"key":"ref7","first-page":"1112","article-title":"Built-In self repair for embedded high-density SRAM","author":"kim","year":"1998","journal-title":"Proc Int Test Conference"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1109\/TEST.2002.1041777","article-title":"Embedded Memory Test & Repair: Infrastructure IP for SOC Yield","author":"zorian","year":"2002","journal-title":"IEEE Int'l Test Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966724"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1126\/science.280.5370.1716","article-title":"A defect-Tolerant Computer Architecture: Opportunities for Nanotechnology","volume":"280","author":"heath","year":"1998","journal-title":"Science"}],"event":{"name":"9th International IEEE On-Line Testing Symposium","acronym":"OLT-03","location":"Kos Island, Greece"},"container-title":["9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8615\/27297\/01214373.pdf?arnumber=1214373","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T04:04:52Z","timestamp":1497585892000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1214373\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/olt.2003.1214373","relation":{},"subject":[]}}