{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T16:15:35Z","timestamp":1725466535580},"reference-count":2,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2003.1214392","type":"proceedings-article","created":{"date-parts":[[2004,3,1]],"date-time":"2004-03-01T21:26:50Z","timestamp":1078176410000},"page":"167","source":"Crossref","is-referenced-by-count":2,"title":["A configurable built in current sensor for mixed signal circuit testing"],"prefix":"10.1109","author":[{"given":"R.","family":"Picos","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Font","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Isern","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Roca","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Garcia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.663562"},{"key":"ref1","first-page":"24","article-title":"IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions","author":"chen","year":"0","journal-title":"IEEE Design & Test of Computers March-April 2002"}],"event":{"name":"9th International IEEE On-Line Testing Symposium","acronym":"OLT-03","location":"Kos Island, Greece"},"container-title":["9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8615\/27297\/01214392.pdf?arnumber=1214392","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T14:42:48Z","timestamp":1489416168000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1214392\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/olt.2003.1214392","relation":{},"subject":[]}}