{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T01:13:29Z","timestamp":1725412409940},"reference-count":10,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2003.1214402","type":"proceedings-article","created":{"date-parts":[[2004,3,1]],"date-time":"2004-03-01T21:26:50Z","timestamp":1078176410000},"page":"219-223","source":"Crossref","is-referenced-by-count":0,"title":["InTeRail: using existing and extra interconnects to test core-based SOCs"],"prefix":"10.1109","author":[{"given":"D.","family":"Kagaris","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Tragoudas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TEST.1990.114058"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TEST.1997.639593"},{"key":"ref10","article-title":"A Structured Test Re-use Methodology for Systems on Silicon","author":"varma","year":"1997","journal-title":"Digest of 1st International Workshop on Testing Embedded Core-Based Systems"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ISCAS.1999.777796"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TEST.2001.966728"},{"key":"ref8","article-title":"Parallelism in Structural Fault Testing of Embedded Cores","author":"nourani","year":"1997","journal-title":"Proc VLSI Test Symposium"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TEST.1998.743166"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1145\/371254.371258"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/VTEST.1997.599435"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TEST.1996.557121"}],"event":{"acronym":"OLT-03","name":"9th International IEEE On-Line Testing Symposium","location":"Kos Island, Greece"},"container-title":["9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8615\/27297\/01214402.pdf?arnumber=1214402","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T19:34:07Z","timestamp":1489433647000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1214402\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/olt.2003.1214402","relation":{},"subject":[]}}