{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T11:25:49Z","timestamp":1730287549468,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/patmos.2013.6662169","type":"proceedings-article","created":{"date-parts":[[2013,11,27]],"date-time":"2013-11-27T21:56:40Z","timestamp":1385589400000},"page":"157-163","source":"Crossref","is-referenced-by-count":7,"title":["A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults"],"prefix":"10.1109","author":[{"given":"R. Possamai","family":"Bastos","sequence":"first","affiliation":[]},{"given":"F. Sill","family":"Torres","sequence":"additional","affiliation":[]},{"given":"J.-M.","family":"Dutertre","sequence":"additional","affiliation":[]},{"given":"M.-L.","family":"Flottes","sequence":"additional","affiliation":[]},{"given":"G.","family":"Di Natale","sequence":"additional","affiliation":[]},{"given":"B.","family":"Rouzeyre","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Nano-Cmos Tool Configured with Default Technology Specifications","year":"2011","key":"19"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1145\/1081081.1081103"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.01.002"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2005.15"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810395"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1994.315652"},{"key":"14","first-page":"592","article-title":"An efficient bics design for seus detection and correction in semiconductor memories","author":"gill","year":"2005","journal-title":"Proc IEEE DATE"},{"key":"11","first-page":"118","article-title":"A novel built-in current sensor for iddq testing of deep submicron cmos ics","author":"athan","year":"1996","journal-title":"Proc IEEE VTS"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1992.243610"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437631"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1078"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.14"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS.2012.6180338"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2006.103"},{"key":"6","first-page":"9","article-title":"Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode","volume":"52","author":"bastos","year":"2012","journal-title":"Elsevier Microelectronics Reliability"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI.2012.6344422"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2011.6131361"},{"key":"9","first-page":"1","article-title":"A new bulk bult-in current sensing circuit for singleevent transient detection","author":"zhang","year":"2010","journal-title":"Proc CCECE IEEE"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.920426"}],"event":{"name":"2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)","start":{"date-parts":[[2013,9,9]]},"location":"Karlsruhe, Germany","end":{"date-parts":[[2013,9,11]]}},"container-title":["2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6646388\/6662142\/06662169.pdf?arnumber=6662169","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T02:10:42Z","timestamp":1490235042000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6662169\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/patmos.2013.6662169","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}