{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T11:25:50Z","timestamp":1730287550290,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/patmos.2013.6662174","type":"proceedings-article","created":{"date-parts":[[2013,11,27]],"date-time":"2013-11-27T21:56:40Z","timestamp":1385589400000},"page":"199-206","source":"Crossref","is-referenced-by-count":2,"title":["Methodology for Power Mode selection in FD-SOI circuits with DVFS and Dynamic Body Biasing"],"prefix":"10.1109","author":[{"given":"Y.","family":"Akgul","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Puschini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Lesecq","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Beigne","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Benoit","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Torres","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","first-page":"994","article-title":"Embedding statistical tests for on-chip dynamic voltage and temperature monitoring","author":"vincent","year":"2012","journal-title":"Proc of Design Automation Conference (DAC)"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2010.5510289"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2011.53"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1007\/s11081-007-9001-7"},{"key":"15","first-page":"1030","article-title":"Joint dynamic voltage scaling and adaptive body biasing for heterogeneous distributed real-time embedded systems computer-aided design of integrated circuits and systems","volume":"24","author":"yan","year":"2005","journal-title":"IEEE Transactions on"},{"key":"16","first-page":"469","article-title":"Optimization of vdd and vth for low-power and high-speed applications design automation conference1 2000","author":"nose","year":"2000","journal-title":"Proceedings of the ASP-DAC 2000"},{"key":"13","first-page":"163","article-title":"Dynamic vth scaling scheme for active leakage power reduction design, automation and test in europe conference and exhibition 2002","author":"kim","year":"2002","journal-title":"Proceedings"},{"key":"14","first-page":"805","article-title":"Delay and power monitoring schemes for minimizing power consumption by means of supply and threshold voltage control in active and standby modes solid-state circuits","volume":"41","author":"nomura","year":"2006","journal-title":"IEEE Journal of"},{"journal-title":"Reduction of the Energy Consumption in Embedded Electronic Devices with Low Control Computational Cost","year":"2011","author":"durand","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1016\/S0166-218X(01)00191-3"},{"key":"21","first-page":"1688","article-title":"Automatic gate biasing of an sccmos power switch achieving maximum leakage reduction and lowering leakage current variability Solid-State Circuits","volume":"43","author":"valentian","year":"2008","journal-title":"IEEE Journal of"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065815"},{"key":"20","first-page":"356","article-title":"Fine-grain dynamic energy tracking for system on chip circuits and systems ii: Express briefs","volume":"60","author":"mansouri","year":"2013","journal-title":"IEEE Transactions on"},{"key":"2","first-page":"131","article-title":"Fine-grained power and body-bias control for near-threshold deep sub-micron cmos circuits emerging and selected topics in circuits and systems","volume":"1","author":"kakoee","year":"2011","journal-title":"IEEE Journal on"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.164"},{"key":"10","first-page":"6","article-title":"Procrastinating voltage scheduling with discrete frequency sets design automation and test in europe 2006 date '06","volume":"1","author":"lu","year":"2006","journal-title":"Proceedings"},{"key":"7","first-page":"181","article-title":"A dc-dc buck converter chip with integrated pwm\/pfm hybrid-mode control circuit power electronics and drive systems 2009 PEDS 2009","author":"chen","year":"2009","journal-title":"International Conference on"},{"key":"6","first-page":"93","article-title":"Vthhopping scheme for 82processors custom integrated circuits 2001","author":"nose","year":"2001","journal-title":"IEEE Conference on"},{"key":"5","first-page":"138","article-title":"A fully integrated power supply unit for fine grain power management application to embedded low voltage srams solid-state circuits conference 2008 esscirc2008 34th","author":"beigne","year":"2008","journal-title":"European"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/FTFC.2012.6231736"},{"key":"9","first-page":"207","article-title":"Integrating dynamic voltage\/frequency scaling and adaptive body biasing using test-time voltage selection Proceedings of the 14th ACM","author":"bonnoit","year":"2009","journal-title":"IEEE Int Symp Low Power Electronics Design"},{"key":"8","first-page":"1940","article-title":"Low-cost and robust control of a dfll for multi-processor system-on-chip","author":"lesecq","year":"2011","journal-title":"The International Federation of Automatic Control (IFAC) Proceedings of the 18th IFAC World Congress 2011"}],"event":{"name":"2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)","start":{"date-parts":[[2013,9,9]]},"location":"Karlsruhe, Germany","end":{"date-parts":[[2013,9,11]]}},"container-title":["2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6646388\/6662142\/06662174.pdf?arnumber=6662174","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T02:15:09Z","timestamp":1490235309000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6662174\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/patmos.2013.6662174","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}