{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:00:16Z","timestamp":1725537616833},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/patmos.2017.8106974","type":"proceedings-article","created":{"date-parts":[[2017,11,16]],"date-time":"2017-11-16T16:50:40Z","timestamp":1510851040000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Timing modeling at RT-level by separation of design- and stress related aging impacts"],"prefix":"10.1109","author":[{"given":"Nils","family":"Koppaetzky","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Malte","family":"Metzdorf","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Reef","family":"Eilers","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Domenik","family":"Helms","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wolfgang","family":"Nebel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-74442-9_17"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRWS.2009.5383023"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0091"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5195975"},{"journal-title":"Morv generic technology aging data base","year":"0","key":"ref11"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2627369.2627618"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2289874"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654309"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2164543"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2008.4771785"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173221"}],"event":{"name":"2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","start":{"date-parts":[[2017,9,25]]},"location":"Thessaloniki","end":{"date-parts":[[2017,9,27]]}},"container-title":["2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8095277\/8106944\/08106974.pdf?arnumber=8106974","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,18]],"date-time":"2017-12-18T18:04:30Z","timestamp":1513620270000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8106974\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/patmos.2017.8106974","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}