{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T22:15:22Z","timestamp":1725747322529},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/patmos.2018.8464155","type":"proceedings-article","created":{"date-parts":[[2018,9,13]],"date-time":"2018-09-13T21:47:06Z","timestamp":1536875226000},"page":"13-18","source":"Crossref","is-referenced-by-count":2,"title":["A 40nm Critical Path Monitor for the Detection of Setup and Hold Time Violations"],"prefix":"10.1109","author":[{"given":"Hernan","family":"Aparicio","sequence":"first","affiliation":[]},{"given":"Pablo","family":"Ituero","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.859879"},{"key":"ref11","first-page":"56","article-title":"Hotspot-limited microprocessors: Direct temperature and power distribution measurements","author":"hendrik","year":"2007","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"114","DOI":"10.1109\/ETSYM.2004.1347622","article-title":"Signal. integrity verification using high speed monitors","author":"avendano","year":"2004","journal-title":"Proceedings of Ninth IEEE European Test Symposium"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"78","DOI":"10.1145\/871506.871529","article-title":"Full chip leakage estimation considering power supply and temperature variations","author":"su","year":"2003","journal-title":"Proceedings of the 2003 International Symposium on Low Power Electronics and Design"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5434077"},{"key":"ref15","first-page":"123","article-title":"System level analysis of fast, per-core dvfs using on-chip switching regulators","author":"kim","year":"2008","journal-title":"High Performance Computer Architecture 2008 HPCA 2008 IEEE 14th International Symposium on"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2016.7753334"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2011.5993672"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-76472-6_7"},{"key":"ref5","first-page":"7","article-title":"Razor: A low-power pipeline based on circuit-level timing speculation","author":"ernst","year":"2003","journal-title":"Microarchitecture 2003 MICRO-36 Proceedings 36th Annual IEEE\/ACM International Symposium on"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.838021"},{"key":"ref7","first-page":"249","article-title":"Dynamic measurement of critical-path timing","author":"alan","year":"2008","journal-title":"Integrated Circuit Design and Technology and Tutorial 2008 ICICDT 2008 IEEE International Conference on"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"398","DOI":"10.1109\/ISSCC.2007.373462","article-title":"A distributed critical-path timing monitor for a 65nm high-performance microprocessor","author":"drake","year":"2007","journal-title":"Solid-State Circuits Conference 2007 ISSCC 2007 Digest of Technical Papers IEEE International"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.896909"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2004.1274005"}],"event":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","start":{"date-parts":[[2018,7,2]]},"location":"Platja d'Aro","end":{"date-parts":[[2018,7,4]]}},"container-title":["2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8450936\/8463989\/08464155.pdf?arnumber=8464155","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T09:44:39Z","timestamp":1643190279000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8464155\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/patmos.2018.8464155","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}