{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T16:38:54Z","timestamp":1725554334924},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/prime.2018.8430340","type":"proceedings-article","created":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T19:56:49Z","timestamp":1534535809000},"page":"21-24","source":"Crossref","is-referenced-by-count":2,"title":["Generalization of Referenceless Timing Mismatch Calibration Methods for Time-Interleaved ADCs"],"prefix":"10.1109","author":[{"given":"Arda","family":"Uran","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mustafa","family":"Kilic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yusuf","family":"Leblebici","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865649"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050309"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2636209"},{"key":"ref13","first-page":"1","article-title":"IEEE standard for terminology and test methods for analog-to-digital converters","year":"2011","journal-title":"IEEE Std 1241-2010 (Revision of IEEE Std 1241-2000)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-1511-4_2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/81.915383"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2239005"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2108125"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2012.6330655"},{"key":"ref7","first-page":"1","article-title":"A supposedly clever thing I’ll never do again","author":"buchwald","year":"2017","journal-title":"2017 IEEE Custom Integrated Circuits Conference (CICC)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.6060"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1980.1051512"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2313571"}],"event":{"name":"2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)","start":{"date-parts":[[2018,7,2]]},"location":"Prague","end":{"date-parts":[[2018,7,5]]}},"container-title":["2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8410979\/8430100\/08430340.pdf?arnumber=8430340","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T03:03:37Z","timestamp":1598238217000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8430340\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/prime.2018.8430340","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}